Microelectronics Reliability
 1995
DOI: 10.1016/0026-2714(95)93076-m
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Design of integrated BiCMOS operational amplifiers with low-probability EMI-induced-failures

Pierre‐Olivier Mattei
1
,
Sandro Graffi
2
,
Zs.M. Kovács-V
3
et al.
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Cited by 5 publications
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References 13 publications
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Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review

Masetti
1
,
Graffi
2
,
Golzio
3
et al. 1996
Microelectronics Reliability
50
0
27
0
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Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review

Masetti
1
,
Graffi
2
,
Golzio
3
et al. 1996
Microelectronics Reliability
50
0
27
0
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Criteria to reduce failures induced from conveyed electromagnetic interferences on CMOS operational amplifiers

Graffi
1
,
Masetti
2
,
Piovaccari
3
1997
Microelectronics Reliability
22
0
7
0
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Design of a low EMI susceptibility CMOS transimpedance operational amplifier

Setti
1
,
Speciale
2
1998
Microelectronics Reliability
16
0
8
0
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