2019 IEEE Symposium Series on Computational Intelligence (SSCI) 2019
DOI: 10.1109/ssci44817.2019.9003135
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Design of IGBT Parameter Automatic Test System Based on LabVIEW

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Cited by 2 publications
(1 citation statement)
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“…A comparative study of the junction temperature variation in SiC-based MOSFETs and silicon-based IGBTs and photovoltaic inverter applications, as well as the junction temperature of semiconductors which can determine and compare the thermal constraints of SiC MOSFETs and silicon-based IGBT power modules, was shown in [14]. The presence of electromagnetic interference in the AE measurement and its contribution to the signal obtained in the GTO thyristor is shown in [15].…”
Section: Marine Power Electronic Switching Systemsmentioning
confidence: 99%
“…A comparative study of the junction temperature variation in SiC-based MOSFETs and silicon-based IGBTs and photovoltaic inverter applications, as well as the junction temperature of semiconductors which can determine and compare the thermal constraints of SiC MOSFETs and silicon-based IGBT power modules, was shown in [14]. The presence of electromagnetic interference in the AE measurement and its contribution to the signal obtained in the GTO thyristor is shown in [15].…”
Section: Marine Power Electronic Switching Systemsmentioning
confidence: 99%