“…The XRD peaks are positioned at 15.5°, 20.25°, 21.7°, 26.25°, 30.2°, 33.45°, 41.9°, 47.15°, 49.05°, 55°, 61.85°, and 71.5° corresponding to the crystal planes ( 200), ( 100), ( 110), ( 101), ( 400), ( 111), ( 020), ( 600), ( 021), ( 012), ( 402) and ( 231), respectively, and presented orthorhombic crystal structure of both samples as per JCPDS card no. 01-0359 and match with literature reports (Cao et al 2020). It can be clearly observed that Ni-doping has influenced diffraction patterns, i.e.…”