2014
DOI: 10.1002/adma.201404625
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Design of an Efficient Charge‐Trapping Layer with a Built‐In Tunnel Barrier for Reliable Organic‐Transistor Memory

Abstract: A fully feasible and versatile way to fabricate highly reliable organic-transistor memory devices is made possible by a novel design of the charge-trappling layer. Gold@silica (core-shell)-structured nanoparticles are synthesized and used as the charge-trapping layer. Superior electrical reliability is obtained because the silica shell acts as a built-in tunnel potential barrier.

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Cited by 46 publications
(46 citation statements)
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References 31 publications
(49 reference statements)
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“…Therefore, the mixture was stirred thoroughly to mix it. After mixing, the solution was red because of the surface plasmon resonance of Au NPs . The color started to darken after 3 h due to agglomeration of Au NPs, and was dark purple after 12 h .…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, the mixture was stirred thoroughly to mix it. After mixing, the solution was red because of the surface plasmon resonance of Au NPs . The color started to darken after 3 h due to agglomeration of Au NPs, and was dark purple after 12 h .…”
Section: Resultsmentioning
confidence: 99%
“…It is a challenge to create intrinsic traps in the dielectric layer without high temperature processing steps [1]. While low temperature processed memory devices fabricated from polymers have been demonstrated as an alternative [2][3][4][5][6][7], their performance degrade rapidly after a few cycles of operation [8][9][10][11][12][13][14]. Moreover conventional memory devices need the support of tunneling and blocking layers since the memory dielectric or polymer is incapable of preventing memory leakage [15][16][17].…”
mentioning
confidence: 99%
“…Among the many approaches, chargeable organic transistor memory (COTM) which exploits the electrical bistability originating from the modulation of channel conductance by charge trapping in the gate dielectric systems confers unique advantages such as nondestructive data read‐out, circuit architectural compatibility, single transistor realization, and reliable switching characteristic . Among the tremendous research progress over the past decades, much attention has been focused on exploring architectures based on floating gates and chargeable electrets using different materials systems, including small molecule, conjugated polymer as well as oxide semiconductors. Substantial improvements in flexibility, memory window (MW) and retention, capability of multibit storage, and realization of new functionalities, for example, pressure sensors integrated into memory arrays have been achieved.…”
mentioning
confidence: 99%
“…The writing timescales reported for COTMs based on chargeable gate systems range from microseconds to seconds . In terms of writing speed polymer electret‐based architectures tend to outperform floating‐gate devices as the latter inevitably comprise relatively thick tunneling dielectrics to ensure reliable isolation of the floating gates.…”
mentioning
confidence: 99%