2011 IEEE ICMTS International Conference on Microelectronic Test Structures 2011
DOI: 10.1109/icmts.2011.5976842
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Design of a test chip with small embedded temperature sensor structures realized in a common-drain power trench technology

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Cited by 3 publications
(3 citation statements)
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“…2. The base-emitter voltage [5] depends on the temperature under a biased constant current, and the change of V BE under this biased constant current can be measured as follows:…”
Section: Temperature Sensormentioning
confidence: 99%
See 1 more Smart Citation
“…2. The base-emitter voltage [5] depends on the temperature under a biased constant current, and the change of V BE under this biased constant current can be measured as follows:…”
Section: Temperature Sensormentioning
confidence: 99%
“…The doping concentrations of the P and N pillars in an SJ TMOSFET are denoted by N A and N D , respectively. The relationship between the doping concentrations and widths of the pillars is as follows: In this paper, a bipolar diode structure is used as a temperature sensor because of the linear dependency of its diode voltage on temperature [4]- [5]. A temperature-dependent model with self-heating characteristics has been implemented and will be described in the next section.…”
Section: Introductionmentioning
confidence: 99%
“…In the SJ TMOSFET, the breakdown voltage is proportional to the length of the drift region of   as shown in Eq. (2).…”
Section: Introductionmentioning
confidence: 99%