Emitter overheating is by far the largest problem limiting the performance of novel C12A7 hollow cathodes. To explore the failure operating point and degradation mechanism of the C12A7 hollow cathode, microscopic analyses of a degraded electride emitter after ten hours of thermal electron emission are presented in this paper. The morphology and composition variation of overheated electride emitters by SEM, EDS, and XRD indicate the melting and decomposition of electride of the surface layer. The monitored temperature of the electride emitter during the C12A7 hollow cathode operation shows that to avoid overheating the electride emitter, the average current density should be about 64 mA/mm2 allowed for the C12A7 hollow cathode in its current configuration. Experiment results of the heaterless C12A7 hollow cathode demonstrate that the Xe ions bombardment can remove the insulating layer and restore the thermionic emission capability for less degraded emitters. Based on experimental results and microscopic characterization, the depletion and degradation mechanism of electride emitters during the hollow cathode operation are discussed.