Design of a delay-line position-sensitive detector with improved performance

Costa, G. Da; Vurpillot, F.; Bostel, A.; Bouet, Mathieu; Déconihout, B.

doi:10.1063/1.1829975

Cited by 174 publications

(121 citation statements)

References 18 publications

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“…These times are converted into true x and y distances on the detector. Today's crossed delay line detectors and high speed digital timing systems provide 1000ϫ 1000 pixels at rates up to 500 000 ions/ s. 39 The electronics are designed to discriminate between hits separated in space or time by more than about 5 ns ͑time resolution on a delay line detector is equivalent to spatial resolution across the detector.͒ Da Costa et al 58 have used novel digitization and deconvolution of the timing signals in a delay line detector to improve this multihit resolution to about 1.5 ns. The computational burden on the digital electronics system needed to process this information can limit the cycle time of the instrument, but that concern is greatly diminished with fast processors.…”

Section: The Three-dimensional Atom Probementioning

confidence: 99%

Atom probe tomography

Kelly¹,

Miller

2007

Review of Scientific Instruments

751

345

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The technique of atom probe tomography ͑APT͒ is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution ͑sub-0.3-nm͒ three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.

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Section: The Three-dimensional Atom Probementioning

confidence: 99%

Atom probe tomography

Kelly¹,

Miller

2007

Review of Scientific Instruments

751

345

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“…[31,32]. The spectrometer uses two acceleration regions 2) is used [35,36]. The trigger signal is derived from the master oscillator of the FEL.…”

Section: Ii11 Amo Science At Scss Test Accelerator In Japan (Sendaimentioning

confidence: 99%

Non-linear processes in the interaction of atoms and molecules with intense EUV and X-ray fields from SASE free electron lasers (FELs)

Berrah

Bozek

Costello

et al. 2010

Journal of Modern Optics

109

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The advent of free electron laser (FEL) facilities capable of delivering high intensity pulses in the extreme-UV to X-ray spectral range has opened up a wide vista of opportunities to study and control light matter interactions in hitherto unexplored parameter regimes. In particular current short wavelength FELs can uniquely drive nonlinear processes mediated by inner shell electrons and in fields where the photon energy can be as high as 10 keV and so the corresponding optical period reaches below one attosecond. Combined with ultrafast optical lasers, or simply employing wavefront division, pump probe experiments can be performed with femtosecond time resolution. As single photon ionization of atoms and molecules is by now very well understood, they provide the ideal targets for early experiments by which not only can FELs be characterised and benchmarked but also the natural departure point in the hunt for nonlinear behaviour of atomistic systems bathed in laser fields of ultrahigh photon energy. In this topical review we illustrate with specific examples the gamut of apposite experiments in atomic, molecular physics currently underway at the SCSS test accelerator (Japan), FLASH (Hamburg) and LCLS (Stanford).

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“…The dead time of the detector together with the efficiency of the process to resolve multiple hits are the factors governing the severity of the effect. Detectors have been designed for improved multiple hit detection [5], but they are slower and more expensive than the detectors of most commercial instruments.…”

Section: Introductionmentioning

confidence: 99%

Reduction of multiple hits in atom probe tomography

et al. 2013

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The accuracy of compositional measurements using atom probe tomography is often reduced because some ions are not recorded when several ions hit the detector in close proximity to each other and within a very short time span. In some cases, for example in analysis of carbides, the multiple hits result in a preferential loss of certain elements, namely those elements that frequently field evaporate in bursts or as dissociating molecules. In this paper a method of reducing the effect of multiple hits is explored. A fine metal grid was mounted a few millimeters behind the local electrode, effectively functioning as a filter. This resulted in a decrease in the overall detection efficiency, from 37% to about 5%, but also in a decrease in the fraction of multiple hits. In an analysis of tungsten carbide the fraction of ions originating from multiple hits decreased from 46% to 10%. As a result, the measured carbon concentration increased from 48.2 at.% to 49.8 at.%, very close to the expected 50.0 at.%. The characteristics of the multiple hits were compared for analyses with and without the grid filter.

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Design of a delay-line position-sensitive detector with improved performance

Cited by 174 publications

References 18 publications

Atom probe tomography

Atom probe tomography

Non-linear processes in the interaction of atoms and molecules with intense EUV and X-ray fields from SASE free electron lasers (FELs)

Reduction of multiple hits in atom probe tomography

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