2019
DOI: 10.1016/j.ultramic.2019.112834
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Design for a 10 keV multi-pass transmission electron microscope

Abstract: Multi-pass transmission electron microscopy (MPTEM) has been proposed as a way to reduce damage to radiation-sensitive materials. For the field of cryo-electron microscopy (cryo-EM), this would significantly reduce the number of projections needed to create a 3D model and would allow the imaging of lower-contrast, more heterogeneous samples. We have designed a 10 keV proof-of-concept MPTEM. The column features fast-switching gated electron mirrors which cause each electron to interrogate the sample multiple ti… Show more

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Cited by 18 publications
(12 citation statements)
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References 28 publications
(35 reference statements)
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“…The need for only a single un-tilted image greatly simplifies acquisition and makes cHRTM compatible with pulsed-beam (Spence 2017) and multi-pass imaging techniques (Juffmann et al 2017;Koppell et al 2019), both designed to increase the amount of highresolution information extracted before it is lost to radiation damage. Together with improved detectors, this might well boost the sensitivity of cHRTM enough to make the majority of proteins detectable.…”
mentioning
confidence: 99%
“…The need for only a single un-tilted image greatly simplifies acquisition and makes cHRTM compatible with pulsed-beam (Spence 2017) and multi-pass imaging techniques (Juffmann et al 2017;Koppell et al 2019), both designed to increase the amount of highresolution information extracted before it is lost to radiation damage. Together with improved detectors, this might well boost the sensitivity of cHRTM enough to make the majority of proteins detectable.…”
mentioning
confidence: 99%
“…After passing through the sample m times, the light leaves the cavity and is imaged using a microscope objective onto a camera. Analogous to light optical design, multi-pass microscopy was simulated (Juffmann et al, 2017) and designed for TEM (Koppell et al, 2019). Figure 3 shows a schematic view of a MPTEM setup (Koppell et al, 2019).…”
Section: Multi-pass Transmission Electron Microscopymentioning
confidence: 99%
“…Analogous to light optical design, multi-pass microscopy was simulated (Juffmann et al, 2017) and designed for TEM (Koppell et al, 2019). Figure 3 shows a schematic view of a MPTEM setup (Koppell et al, 2019).…”
Section: Multi-pass Transmission Electron Microscopymentioning
confidence: 99%
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