2019
DOI: 10.1016/bs.aiep.2019.08.003
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Electron optics for a multi-pass transmission electron microscope

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Cited by 3 publications
(1 citation statement)
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“…For example, by using aberration correctors 136,[157][158][159] , choosing scan shapes and speeds that minimize distortions 138 , and using stable sample holders to reduce drift 160 . Beam damage can also be reduced by using minimal electron voltage and electron dose [161][162][163] , or dose-fractionation across multiple frames in multi-pass TEM [164][165][166] or STEM 167 .…”
Section: Improving Signal-to-noisementioning
confidence: 99%
“…For example, by using aberration correctors 136,[157][158][159] , choosing scan shapes and speeds that minimize distortions 138 , and using stable sample holders to reduce drift 160 . Beam damage can also be reduced by using minimal electron voltage and electron dose [161][162][163] , or dose-fractionation across multiple frames in multi-pass TEM [164][165][166] or STEM 167 .…”
Section: Improving Signal-to-noisementioning
confidence: 99%