Design and verification of analog CMOS circuits using the g&lt;inf&gt;m&lt;/inf&gt;/I&lt;inf&gt;D&lt;/inf&gt;-method with age-dependent degradation effects

Hillebrand, Theodor; Schafer, Timur; Hellwege, Nico; Erstling, Marco; Peters-Drolshagen, Dagmar; Paul, Steffen

doi:10.1109/patmos.2016.7833678

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Design and verification of analog CMOS circuits using the g<inf>m</inf>/I<inf>D</inf>-method with age-dependent degradation effects

Cited by 6 publications

References 8 publications

Impact of Transistor Aging on the Reliability of the Analog Circuit

Impact of Transistor Aging on the Reliability of the Analog Circuit

Design and Analysis of CMOS Analog Circuit in Systematic Method on 130nm

The $\mathrm{g}_{\mathrm{m}}/\mathrm{I}_{\mathrm{d}}$ Methodology based Design and Optimization of Analog Circuits

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