Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain

Kazemipour, Alireza; Hudlička, Martin; Yee, See Khee; Salhi, Mohammed; Allal, Djamel; Kleine‐Ostmann, Thomas; Schräder, Thorsten

doi:10.1109/tim.2014.2376115

Cited by 60 publications

(49 citation statements)

References 18 publications

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“…FSM method has better dynamic capacity and spectral resolution than other methods [21]. However, FSM method could not be widening unless development of measuring devices for last decade [22]. Thus, measurement of the complex permittivity is possible over a wide frequency range by means of advanced measuring equipment and the FSM method accurately [23].…”

Section: Free Space Measurement Methodsmentioning

confidence: 99%

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Öztürk¹,

Guneser²

2019

Electrical and Electronic Properties of Materials

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Material characterization plays an important role in many applications that are called as security, military, communication, bioengineering, medical treatment, food industry, and material processing, since it is useful to identify other properties such as stress-strain relation, bio content, moisture content, materials density, etc. Therefore, the dielectric properties of materials should be achieved with high accuracy using appropriate measurement techniques and extraction techniques. There are many measurement methods to obtain the dielectric properties of materials, which can be divided into two categories: up conversion and down conversion methods. A microwave measurement method can be called as frequency up conversion, while THz time-domain spectroscopy (THz-TDS) system is a frequency down conversion method. The selection of more convenient measurement method depends on some parameters such as frequency range, material phase, and temperature. In this chapter, the measurement methods and extraction techniques will be discussed, and alternative ways will be presented with experimental and simulation results.

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Section: Free Space Measurement Methodsmentioning

confidence: 99%

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Öztürk¹,

Guneser²

2019

Electrical and Electronic Properties of Materials

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“…According to the manufacturer of the waveguides used for this investigation, the aperture tolerances are specified as ±5 μm and so the corresponding worst-case reflection given in [27] is −34 dB. 1 This is equivalent to a linear reflection coefficient of 0.020. This worst-case reflection error, Δ(Γ 1 ), is converted to an equivalent standard uncertainty, u(Γ 1 ), using [26]:…”

Section: Vna Measurement Uncertaintymentioning

confidence: 99%

Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

Naftaly

Shoaib

Stokes

et al. 2016

J Infrared Milli Terahz Waves

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We describe a method for direct intercomparison of terahertz permittivities at 200 GHz obtained by a Vector Network Analyzer and a Time-Domain Spectrometer, whereby both instruments operate in their customary configurations, i.e., the VNA in waveguide and TDS in free-space. The method employs material that can be inserted into a waveguide for VNA measurements or contained in a cell for TDS measurements. The intercomparison experiments were performed using two materials: petroleum jelly and a mixture of petroleum jelly with carbon powder. The obtained values of complex permittivities were similar within the measurement uncertainty. An intercomparison between VNA and TDS measurements is of importance because the two modalities are customarily employed separately and require different approaches. Since material permittivities can and have been measured using either platform, it is necessary to ascertain that the obtained data is similar in both cases.

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“…Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies.…”

Section: Introductionmentioning

confidence: 99%

“…Their bandwidths have been broadening and operating frequency bands have been moving to the submillimeter frequency range. Measurements of the electrical properties of EM materials have gained considerable importance, particularly in the millimeter and submillimeter frequency ranges, as material parameters are fundamental parameters in the natural and application sciences fields [1,2].Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies.…”

mentioning

confidence: 99%

“…receive (Rx) antennas that are connected to the test ports of an S-parameter measuring instrument through two focused Gaussian beams generated by spot-focused horn lens antennas [5,6], corrugated horn antennas with mirrors [7][8][9], and planar focusing arrays [10]. The reflection ellipsometry method is a wellestablished method for material characterization in optics and has been recently adapted to millimeter frequencies to determine material properties from the change of the polarization state of the wave reflected by an MUT that is illuminated by the linear-polarized wave radiated by a Tx antenna.…”

mentioning

confidence: 99%

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Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

Kang

Kim

Kang³

et al. 2018

J Electromagn Eng Sci

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I. INTRODUCTIONRecently, uses and applications of electromagnetic (EM) materials, devices, and systems have been becoming more popular in the fields of both the natural sciences, such as physics, chemistry, biology, earth science, and astronomy, and the application sciences, such as telecommunications, military, defense, security, transportation, and medicine. Their bandwidths have been broadening and operating frequency bands have been moving to the submillimeter frequency range. Measurements of the electrical properties of EM materials have gained considerable importance, particularly in the millimeter and submillimeter frequency ranges, as material parameters are fundamental parameters in the natural and application sciences fields [1,2].Various methods have been developed in millimeter and submillimeter frequency ranges to measure material properties (usually complex permittivity and permeability), e.g., the open resonator [3,4], free space [5][6][7][8][9][10], and reflection ellipsometry methods [11][12][13]. The open resonator method provides accurate material properties at discrete resonance frequencies. The free space method is based on the quasi-optic approach where the material under test (MUT) is coupled to transmit (Tx) and This paper describes specular reflectance measurements of dielectric plates in three waveguide frequency bands: D-band (110-170 GHz), G-band (140-220 GHz), and J-band (220-325 GHz). The transmit (Tx) part of the proposed specular reflectance measurement system is stationary, while the receive (Rx) part and the material under test (MUT) holder are concentric-rotating with a 2:1 speed ratio for specular reflectance measurements. In specular reflectance measurements, the first step measures the specular reflection coefficients of an MUT and a metal plate on the MUT holder located at the center of the Tx and Rx parts, and the second step calculates the specular reflectance defined by the specular reflection power (i.e., intensity) of the MUT normalized to that of the metal plate. Multiple reflection effects between the Tx and Rx antennas and the MUT on the measured specular reflectance are minimized by averaging out the multiple specular reflectances measured with changing the separation distance between the two antennas by λ/8 intervals. Measurement results of the perpendicular-polarized specular reflectance of commonly used dielectric plates are verified by comparing those with the analytic results and show that the results measured over the overlapped frequency range of the D-/G-bands and at the boundary frequency of the G-/J-bands agree well with the results for the other band, respectively. This is an Open-Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0) which permits unrestricted non-commercial use, distribution, and reproduction in any medium, provided the original work is properly cited. ⓒ

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Design and Calibration of a Compact Quasi-Optical System for Material Characterization in Millimeter/Submillimeter Wave Domain

Cited by 60 publications

References 18 publications

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Measurement Methods and Extraction Techniques to Obtain the Dielectric Properties of Materials

Intercomparison of Terahertz Dielectric Measurements Using Vector Network Analyzer and Time-Domain Spectrometer

Specular Reflectance Measurements of Dielectric Plates in Millimeter Frequency Range

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