2019 IEEE International Symposium on Smart Electronic Systems (iSES) (Formerly iNiS) 2019
DOI: 10.1109/ises47678.2019.00042
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Design and ASIC Implementation of a Reconfigurable Fault-Tolerant ALU for Space Applications

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Cited by 5 publications
(4 citation statements)
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“…While the hardness of commercial ICs has generally improved considering hard errors, the technological changes resulted in more susceptibility to transient radiation effects, thus requiring more attention to faults caused by SEE [16]. Among SEEs, we can distinguish Single-Event Transient (SET) that model the transitory variation of a combinatory output and Single-Event Upset (SEU) that represents the toggle (or bit-flip) of a memory element state when a SEE occurs [6,11,16].…”
Section: Related Workmentioning
confidence: 99%
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“…While the hardness of commercial ICs has generally improved considering hard errors, the technological changes resulted in more susceptibility to transient radiation effects, thus requiring more attention to faults caused by SEE [16]. Among SEEs, we can distinguish Single-Event Transient (SET) that model the transitory variation of a combinatory output and Single-Event Upset (SEU) that represents the toggle (or bit-flip) of a memory element state when a SEE occurs [6,11,16].…”
Section: Related Workmentioning
confidence: 99%
“…This is no longer just a concern for space applications, as even commercially used nanoscale circuits at sea level have become more susceptible to particles present in the atmosphere [1][2][3][4]. The widespread presence of ICs in various fields, including aerospace, military, medical systems, and even household appliances, such as Internet of Things (IoT) systems, makes fault-tolerant techniques increasingly important for space and terrestrial applications [5][6][7]. Finding efficient methods for evaluating these techniques to meet this demand is essential.…”
Section: Introductionmentioning
confidence: 99%
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“…To improve the performance with low-overhead, selective TMR approach can be used. The selective TMR approach provides the fault-tolerance capability to frequently used blocks such as arithmetic logic units (ALUs) [17], register files [14], even only multipliers [18]. However, the fault tolerance capability in the selective TMR approach is less compared to the conventional TMR approach [19].…”
Section: Introductionmentioning
confidence: 99%