2016
DOI: 10.1590/s1517-707620160002.0046
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Desenvolvimento e avaliação de uma fonte DC de alta tensão para utilização em sistema de deposição de filmes finos por pulverização catódica

Abstract: RESUMOO trabalho em questão está relacionado ao projeto e construção de uma fonte de alta tensão em corrente contínua utilizando materiais e dispositivos adquiridos no comércio local visando sua aplicação no processo de pulverização catódica. Essa técnica permite a deposição de filmes finos de metais, óxidos e nitretos sobre substratos sólidos. Como teste de funcionamento e aplicação da fonte DC, com a mesma instalada em canhão de pulverização em alto vácuo, filmes finos de diferentes espessuras de cobre, aço … Show more

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Cited by 5 publications
(5 citation statements)
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“…Novello () studied AISI 304 stainless steel surfaces, and found the presence of silver at 25 nm and 15 nm depth, at 200 and 70 keV implantation, respectively. Considering that the sputtering proposed by Novello () used complex techniques that cannot be used on a large scale, the method proposed in the present study using sputtering makes the process viable from the industrial point of view, once it is a suitable and recognized technique for the film deposition on large areas (Machuno et al, ).…”
Section: Resultsmentioning
confidence: 99%
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“…Novello () studied AISI 304 stainless steel surfaces, and found the presence of silver at 25 nm and 15 nm depth, at 200 and 70 keV implantation, respectively. Considering that the sputtering proposed by Novello () used complex techniques that cannot be used on a large scale, the method proposed in the present study using sputtering makes the process viable from the industrial point of view, once it is a suitable and recognized technique for the film deposition on large areas (Machuno et al, ).…”
Section: Resultsmentioning
confidence: 99%
“…Some risks are also observed, probably due to the mechanical cleaning process or even the steel rolling process. Concerning the silver film coated sample ( Figure 1b) a slight change in the surface is observed with the presence of agglomerates due to the nucleation process in the vapor phase, a common effect of the sputtering process (Machuno et al, 2016). A careful analysis of the surface roughness by atomic force microscopy (AFM) resulted in values of 6.6 ± 2.56 nm and 12.8 ± 5.7 nm for the control and silver film coated samples, respectively, indicating that the silver deposit contributes to a rougher surface.…”
Section: Resultsmentioning
confidence: 99%
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“…Prior the deposition, the samples were immersed in neutral detergent during 1 h, rinsed with distilled water, dried and cleaned with 70% (v/v) alcohol. The Nb 2 O 5 thin films were deposited using argon (99.99%) and oxygen (99.99%) at 5.0 and 0.5 mTorr in a DCmagnetron sputtering [11]. Over a Niobium (99.99%) 2-in.…”
Section: Methodsmentioning
confidence: 99%