Ion Beam Surface Layer Analysis 1976
DOI: 10.1007/978-1-4615-8876-4_5
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Depth Profiling of Implanted 3He in Solids by Nuclear Reaction and Rutherford Backscattering

J. Roth
1
,
O. Meyer2,
R. Behrisch
3
et al.
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Cited by 3 publications
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