2006
DOI: 10.1016/j.jelechem.2006.02.006
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Deposition of HgTe by electrochemical atomic layer epitaxy (EC-ALE)

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Cited by 27 publications
(17 citation statements)
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“…Until now, ECALE method has been extensively applied to obtain thin films of IIB-VIA compound semiconductors such as CdTe [13,14], ZnSe [15], HgTe [16]. IIIA-VA compound GaAs [17], InAs [18] as well as IIIA-VIA compound In 2 Se 3 [19], IVA-VIA compound PbSe [11], PbTe [12], VA-VIA [20,22] compounds and superlattices of InAs/InSb [23], CdS/CdSe [24], PbTe/PbSe [25], and Bi 2 Te 3 /Sb 2 Te 3 [26] have also been prepared by ECALE.…”
Section: Introductionmentioning
confidence: 99%
“…Until now, ECALE method has been extensively applied to obtain thin films of IIB-VIA compound semiconductors such as CdTe [13,14], ZnSe [15], HgTe [16]. IIIA-VA compound GaAs [17], InAs [18] as well as IIIA-VIA compound In 2 Se 3 [19], IVA-VIA compound PbSe [11], PbTe [12], VA-VIA [20,22] compounds and superlattices of InAs/InSb [23], CdS/CdSe [24], PbTe/PbSe [25], and Bi 2 Te 3 /Sb 2 Te 3 [26] have also been prepared by ECALE.…”
Section: Introductionmentioning
confidence: 99%
“…Additionally, a reductive signal at ≈−0.8 V versus Ag/AgCl was also noted in all scans, which could be ascribed to the cathodic stripping of tellurium. [ 15,52 ] Both of these peaks are still fairly discernible in the subsequent scans suggesting that some form of reversible oxidative/reduction process is going on, where the peak at ≈0.3 V versus Ag/AgCl corresponds to the oxidation of the product from the reductive process at ≈−0.8 V versus Ag/AgCl and vice versa. Furthermore, close scrutinization of the cathodic scans of the V‐doped MoTe 2 reveals the presence of an additional oxidative peak at ≈0.6 V versus Ag/AgCl for the Mo 0.95 V 0.05 Te 2 material, suggesting the formation of a new tellurium species through an oxidation process.…”
Section: Resultsmentioning
confidence: 99%
“…Blank solution was then flushed through the cell for 3 s, followed by filling the cell with the Hg solution for 2 s and holding quiescent for 15 s for deposition. The cycle was completed by flushing with blank solution for 3 s. 61 CdTe ML depositions were performed using the following cycle: Cd solution was flushed into the cell for 2 s ͑40 mL/min͒ and held quiescent for 15 s at the chosen Cd deposition potential. Blank solution was then flushed through the cell for 3 s, followed by filling the cell with the Te solution for 2 s, and holding quiescent for 15 s for deposition at the selected Te deposition potential.…”
Section: Methodsmentioning
confidence: 99%
“…Finally, that a superlattice was not formed is of concern. Superlattices have been formed of PbSe/PbTe, 63 which suggest given reasonable cycles for HgTe 61 and CdTe, 62 a superlattice is likely. Most of the problems in forming a superlattice appear related to the need to deposit Hg at 0.40 V, where the Cd in CdTe is unstable.…”
Section: H722mentioning
confidence: 99%
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