2014
DOI: 10.1016/j.apsusc.2014.05.084
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Deposition and characterization of titanium carbide thin films by magnetron sputtering using Ti and TiC targets

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Cited by 45 publications
(26 citation statements)
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“…However, TiC X has a wide stoichiometry from x = 0.47 to 0.98 and since PVD is a non-equilibrium process, the α-Ti lattice may accept more carbon atoms due to hindered mobility of the deposited particles [15].…”
Section: Accepted M Manuscriptmentioning
confidence: 99%
“…However, TiC X has a wide stoichiometry from x = 0.47 to 0.98 and since PVD is a non-equilibrium process, the α-Ti lattice may accept more carbon atoms due to hindered mobility of the deposited particles [15].…”
Section: Accepted M Manuscriptmentioning
confidence: 99%
“…In addition, some pores are deeper up to 10-15 nm in this film as shown in z-scale of the AFM image. Formation of pores is related to oxidation of metallic compounds and radicals which nucleate and form bigger size [18,19]. Therefore, pores are chemically reactive and generally oxidized which is embedded within smaller particles.…”
Section: Afm Analysismentioning
confidence: 99%
“…The leakage current test of insulators with and without deposition was also performed before and after being subjected to artificial salt spray weathering for alternating current systems with nominal voltages higher than 1000 V [13][14][15][16][17][18][19][20][21][22][23][24][25][26][27][28][29] .…”
Section: Characterization Of the Materialsmentioning
confidence: 99%
“…In cold plasma whose gas is confined in a controlled environment under pressures on the order of 10 -3 Pa, to guarantee greater ionization efficiency for the species, energy sources such as luminescent discharges of direct current and radiofrequency discharges are widely used 22,23 . One of the processes used for the deposition of nanometric films on substrates is sputtering, which promotes the disarrangement and removal of atoms from the surface of the material (target) for deposition on another (substrate) 24 .…”
Section: Introductionmentioning
confidence: 99%