2021
DOI: 10.1016/j.apsusc.2020.148156
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Density functional theory study on the reducing agents for atomic layer deposition of tungsten using tungsten chloride precursor

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Cited by 11 publications
(1 citation statement)
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“…Tungsten (W), due to high melting point, high electrical conductivity, and superior accessibility, [1][2][3][4][5] has been widely used as the word line metal film of 3D NAND flash devices, dynamic random access memory (DRAM) devices, and phase-change memory (PCM) devices [6][7][8][9][10] for decades. Molybdenum (Mo) and tungsten are subgroup six (VIB) elements and have similar physical and chemical properties.…”
Section: Introductionmentioning
confidence: 99%
“…Tungsten (W), due to high melting point, high electrical conductivity, and superior accessibility, [1][2][3][4][5] has been widely used as the word line metal film of 3D NAND flash devices, dynamic random access memory (DRAM) devices, and phase-change memory (PCM) devices [6][7][8][9][10] for decades. Molybdenum (Mo) and tungsten are subgroup six (VIB) elements and have similar physical and chemical properties.…”
Section: Introductionmentioning
confidence: 99%