2020
DOI: 10.1016/j.solmat.2020.110638
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Degradation of plated silicon solar module due to copper diffusion: The role of capping layer formation and contact adhesion

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Cited by 14 publications
(9 citation statements)
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“…Copper metallization can degrade cell performance and the durability of the PV module. 86 A laminate-free design impacts the electricity generation profile and durability of the PV module, which impacts the economic and environmental performance of PV systems. 87 Lead-free alternatives can increase costs and elevate temperatures for soldering, which can cause thermomechanical stress and breakage of the silicon wafer during manufacturing.…”
Section: Design For Circularitymentioning
confidence: 99%
“…Copper metallization can degrade cell performance and the durability of the PV module. 86 A laminate-free design impacts the electricity generation profile and durability of the PV module, which impacts the economic and environmental performance of PV systems. 87 Lead-free alternatives can increase costs and elevate temperatures for soldering, which can cause thermomechanical stress and breakage of the silicon wafer during manufacturing.…”
Section: Design For Circularitymentioning
confidence: 99%
“…For alternative metallisation schemes where selective laser ablation is used to form the opening for a metal contact grid, these simulations suggest that smaller and uniform‐sized pyramids can result in more uniform ablation of the SiN x ARC for contact formation. Recent studies have highlighted that non‐uniform laser ablation can reduce the adhesion of plated metallisation 16 and impact module durability 7 …”
Section: Simulation Of Laser Irradiation On Textured Sinx/si Surfacesmentioning
confidence: 99%
“…Nanosecond and picosecond laser ablation has been successfully deployed to selectively remove dielectric layers on Si solar cells for narrow contact openings of <15 μm in width which are subsequently metallised 1–7 . The high spatial accuracy of these lasers has enabled the alignment of ablated openings to pre‐doped regions of selective‐emitter (SE) passivated emitter and rear contact (PERC) cells 4,6 and interdigitated back contact cells 8,9 .…”
Section: Introductionmentioning
confidence: 99%
“…Cu is one of the most promising materials for re-placing Ag and viably reducing the SC cost up to ∼100 times while maintaining high electrical conductivity. However, the high diffusion activity of Cu at the Si interface remains a major obstacle that prevents the use of Cu as a contact material for SC, since this can lead to the formation of intermetallic phases of Cu with Si that serve as recombination centres [4], as well as compromise the adhesion to substrate [5] due to a porous structure of the Cu/Si interface [6]. An effective solution of this problem may be the use of a diffusion barrier layer of different metals such as V, Cr, Ti, and others [7].…”
Section: Introductionmentioning
confidence: 99%