2008
DOI: 10.1016/j.jpowsour.2008.06.047
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Degradation measurement and analysis for cells and stacks

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Cited by 79 publications
(72 citation statements)
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“…After those experiments, it is concluded that after the initial conditioning of the cell, and for a period of above 1000 hours under operation conditions, it was not possible no quantify any degradation [39]. Those results confirm that the studied cells are suitable to be integrated for mSOFC portable devices.…”
Section: Microstructural Characterizationmentioning
confidence: 67%
“…After those experiments, it is concluded that after the initial conditioning of the cell, and for a period of above 1000 hours under operation conditions, it was not possible no quantify any degradation [39]. Those results confirm that the studied cells are suitable to be integrated for mSOFC portable devices.…”
Section: Microstructural Characterizationmentioning
confidence: 67%
“…10 The important factor to remember about various polarization components is that they are not independent of each other.…”
Section: Ohmic (Resistance) Polarizationmentioning
confidence: 99%
“…where E = either open circuit voltage potential (E OCV ) or the ideal Nernst potential (E N ), depending on whether one wants to (1) remove loss effects due to reactant leakage and variable reactant mixture supply and if one is focused on the cell material performance, or (2) focus on total cell performance (cell material and seals) (Gemmen et al 2008). …”
Section: Polarization Lossesmentioning
confidence: 99%