“…These questions have not yet been addressed, in detail, in GaAs, by comparing the properties of deformed and as-grown materials. This global approach has been used recently in a short study on InP [13].…”
The crystal quality improvement by electrical or isoelectronic doping of L.E.C. grown GaAs crystals is related to the thermoelastic modelling of stresses during growth. The dislocation structure in as-grown and annealed crystals is deduced, in particular with the help of the results of plastic deformation. The addition of various elements of the columns II-III-IV-V-VI in GaAs is considered and its influence on the establishment of the dislocation substructure is discussed
“…These questions have not yet been addressed, in detail, in GaAs, by comparing the properties of deformed and as-grown materials. This global approach has been used recently in a short study on InP [13].…”
The crystal quality improvement by electrical or isoelectronic doping of L.E.C. grown GaAs crystals is related to the thermoelastic modelling of stresses during growth. The dislocation structure in as-grown and annealed crystals is deduced, in particular with the help of the results of plastic deformation. The addition of various elements of the columns II-III-IV-V-VI in GaAs is considered and its influence on the establishment of the dislocation substructure is discussed
“…The limitation of this approach is that it ignores the fact that the generation and movement of dislocations in semiconductors is a thermally activated process. Further, the CRSS is a function, not only of the temperature, but also of the strain rate as shown by Muller et al [207]. Lambropoulos [208] deduced, from simulation studies, that once the crystal length had reached about four times its radius, all the significant stress variation occurred close to the interface and the extent of inelastic deformation was so large that it needed to be coupled into the solution for the thermal stresses near the crystal-melt interface.…”
Section: Stress Distribution and Dislocation Generation In Gallium Armentioning
“…This study started already during Völkls’ diploma work in which he measured for the first time in situ the temperature distribution within a growing InP crystal by the use of grown‐in thermocouples. A second important part of the work was the investigation of the plastic deformation of InP crystals by dynamical compression testing experiments at high temperatures in collaboration with the Erlangen group of Wolfgang Blum …”
Section: Development Of Industrial Singe Crystal Melt Growth Technolomentioning
This article describes the historic development of the Erlangen Crystal GrowthLaboratory CGL from its beginnings in 1974 at the chair of Materials of Electrical Engineering (Department of Material Science) of the University of Erlangen-Nuremberg until its current status as a large department "Materials" of the Erlangen Fraunhofer-Institute for Integrated Systems and Device Technology. Essential developments and scientific achievements in the various fields of crystal growth and epitaxy are presented from the early period until today.
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