Defocusing effects in the reflexion technique for the determination of preferred orientation

Abstract

The defocusing of the diffracted beam in a texture goniometer using the reflexion technique for the determination of the preferred orientation is discussed. By means of textureless (random) specimens of the ferromagnetic material Ba3CozFez.,O4~ this defocusing is measured for several diffraction planes in two cases: (1) a narrow and (2) a wide receiving slit. Calibration functions to correct for defocusing effects are calculated using an equation given by Gale & Griffiths [ Brit. J. Appl. Phys. (1960). 11, 96-102]. The calculated functions plotted rersus the angle of specimen tilt are compared with the relative intensities measured on random specimens.

Morphology and microstructure of epitaxial Cu(001) films grown by primary ion deposition on Si and Ge substrates

“…Background subtraction is performed using data from an intensity measurement away from the Bragg angle. Additional corrections are made for defocusing, 16 and absorption. 17,18 We use an x-ray diffractometer operating with CuK␣ radiation and a resolution of 0.01°for measurements of Cu 200 -rocking curves and a FIG.…”

Characterization of the preferred orientation of δ-mannitol crystallites in tablets

“…The pole figures were corrected for contributions from background and defocusing. The defocusing correction was done mathematically using the method by Gale & Griffits [15] with the texture software. The background correction was done with measured data, which was obtained from the vicinity of the diffraction peak in question using ψ angle steps of 5 • and a revolution time of 20 s for the ϕ angle.…”

The texture of diffusion-grown HfAl3 layers

“…The measured intensities were corrected for the intensity loss due to defocusing [4,5]. Correction curves were obtained by measuring intensities on texture-free powder samples of HfAl,.…”