Deflectometry Measurement Method of Single-Camera Monitoring

Chen, 李晨 Li; Xu, 张旭 Zhang; Dawei, 屠大维 Tu; Junhui, 贾君慧 Jia; Wei, 崔 伟 Cui; Can, 张 璨 Zhang

doi:10.3788/aos201737.1012007

Cited by 4 publications

(2 citation statements)

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“…Figure 12(f) demonstrates the reconstruction error, where the less accurate part of the reconstruction error is approximately 1.35 µm. The reconstruction accuracy of the 'line-planes model' has reached the accuracy in the mobile screen model, which is shown in our previous work [26].…”

Section: Surface Measurementsupporting

confidence: 58%

“…The 3D information and normal of the mirror surface are calculated through these two light vectors. Two continuous surface light sources are typically achieved by using two different positions of a single surface light source [3][4][5][6]26] or by two surface light sources with a spectroscope [25]. Figure 1(b) demonstrates the proposed line-planes deflectometry.…”

Section: Line-planes Deflectometrymentioning

confidence: 99%

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Line–planes deflectometry

Zhang

2018

Meas. Sci. Technol.

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The key issue in phase measurement deflectometry is the solution of incident light which is used to determine the surface normal. To restore the 3D mirror surface information, line–planes deflectometry is proposed to determine the surface normal from the reflected light and the incident light planes containing incident light. To this end, a point light source is used to replace the continuous surface light source of traditional deflectometry. Accordingly, the incident light is calculated by the intersection of incident light planes which are determined by two or more projected lights of a point light source. Finally, the precise mirror surface is restored through the radial basis function interpolation from the gradient which is transformed from the normal information. To verify the proposed method, a line–planes deflectometry system is developed with two projectors and one camera. The system can be applied for two measurement modes concerning different measurement requirements: the ‘line–plane model’ and the ‘line–planes model’. The ‘line–plane model’ can be inferred with a measurement error of less than 0.25 mm to measure objects with low accuracy and non-connectivity. In contrast, the ‘line–planes model’ can be used to measure objects with high accuracy and good area connectivity, and the measurement error is about 1 µm.

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Section: Surface Measurementsupporting

confidence: 58%