1982
DOI: 10.1016/0022-0248(82)90288-3
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Defects in PbTe single crystals

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1983
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Cited by 29 publications
(14 citation statements)
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“…It is well krioa-n that such an interface is associated with large thermal stresses a t the position of the interface. The stresses are generally minimum for a planar interface [13]. The creation of the stress results i n the generation arid propagation of defects dnririg directional solidification.…”
Section: Slip Lities Atad Slip Baiids (Tinetched Crystals)mentioning
confidence: 99%
“…It is well krioa-n that such an interface is associated with large thermal stresses a t the position of the interface. The stresses are generally minimum for a planar interface [13]. The creation of the stress results i n the generation arid propagation of defects dnririg directional solidification.…”
Section: Slip Lities Atad Slip Baiids (Tinetched Crystals)mentioning
confidence: 99%
“…PbTe, having indirect band gap of nearly 0.29 eV [1,2] and direct band gap of nearly 0.32 eV [1,3,4], exhibits both p-and n-type conductivity [5][6][7][8][9][10][11]. Because of narrow band gap, PbTe is useful for optoelectronic devices in infrared region [12].…”
Section: Introductionmentioning
confidence: 98%
“…This paper is devoted to the investigation of the problem of interaction between Eu impurities and native defects like Te precipitates during high-temperature annealing in vacuum of PbTe:Eu crystals grown from the melt by Bridgman method. The Te precipitates are dominant non-point native defects in lead and tin tellurides, which are always formed in the crystals grown from the melt [16][17][18]. Examination of the changes of MS crystals under the effect of thermal treatment is used in studying the mentioned problem.…”
Section: Introductionmentioning
confidence: 99%