Defects and faults in quantum cellular automata at nano scale

Tahoori, Mehdi B.; Momenzadeh, M.; Huang, Jiang; Lombardi, Fabrizio

doi:10.1109/vtest.2004.1299255

Cited by 79 publications

(53 citation statements)

References 12 publications

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“…This figure demonstrates that a cell of four quantum dots organized in a square. There are two electrons inside the cell and passage obstructions between adjoining destinations [11,12]. Burrowing out of the cell is thought to be totally stifled.…”

Section: Introductionmentioning

confidence: 99%

1-bit and 2-bit comparator designs and analysis for quantum-dot cellular automata

Mallaiah¹,

Swamy²,

Padmapriya³

2017

Nanosystems: Phys. Chem. Math.

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In PCs, the number of arithmetic operations, the comparator is a vital equipment unit, consisting of complementary metal-oxide-semiconductor (CMOS) technology. Another procedure, referred to as Quantum Cellular Automata (QCA) will supplant the CMOS outlines, having leverage concerning zone, control utilization, and latency. The primary QCA circuits planned with the inverter and majority voter entryways. In this paper, we utilize the clocking method 180 out of phase clock crossover to outline the 1-bit comparator and compare with the current outcomes.The new proposed wire crossing plan lessens the quantity of cells required to configuration, power and area necessities. Additionally, we planned 2-bit comparator having 11 majority gates (voters), 2 number of crossovers with 0.38 µm 2 area, 203 number of cells. The designed 1-bit comparator contrast and the past outcomes where cells, region, delay demonstrates 53.57 %, 50 % and 33.32 % improvement respectively.

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Section: Introductionmentioning

confidence: 99%

1-bit and 2-bit comparator designs and analysis for quantum-dot cellular automata

Mallaiah¹,

Swamy²,

Padmapriya³

2017

Nanosystems: Phys. Chem. Math.

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“…While there have been experimental studies related to defect and fault tolerance in QCA [6], [7], [8], not much work has been done to study the effects of variation in device parameters on error and power in QCA design. Similar studies have been the hallmark of CMOS research over the years that contributed significantly in the development of CMOS technology.…”

Section: Introductionmentioning

confidence: 99%

Error-Power Tradeoffs in QCA Design

Srivastava

Sarkar

Bhanja

2008

2008 8th IEEE Conference on Nanotechnology

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Abstract-In this work we present an error-power tradeoff study in a Quantum-dot Cellular Automata (QCA) circuit design. Device parameter variation to optimize performance is a very crucial step in the development of a technology. In this work we vary the maximum kink energy of a QCA circuit to perform an error-power tradeoff study in QCA design. We make use of graphical probabilistic models to estimate polarization errors and non-adiabatic energy dissipated in a clocked QCA circuit and demonstrate the tradeoff studies on the basic QCA circuits such as majority gate and inverter. We also show how this study can be used by comparing two single bit adder designs. The study will be of great use to designers and fabrication scientists to choose the most optimum size and spacing of QCA cells to fabricate QCA logic designs.

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“…To perform a defect characterization of QCA devices and circuits and study their effects at logiclevel, appropriate defect mechanisms and models have been proposed [13]. According to [1], in the present stage of QCA manufacturing, defects are possible in both the synthesis phase (where the individual cells are manufactured) and the deposition phase (where the cells are attached to a surface).…”

Section: Defect Modelmentioning

confidence: 99%

“…In [12], QCA defects and related effects have been reported mostly at logic level. Testing of QCA devices and their unique features have been investigated in [13]; [11] has considered the C-testability (where C stands for constant) of QCA designs based on majority voters. Based on these properties, test generation and design-fortestability techniques have been proposed [11].…”

Section: Introductionmentioning

confidence: 99%

Defect characterization for scaling of QCA devices

Huang

Momenzadeh

Tahoori

et al.

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings.

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Quantum dot Cellular Automata (QCA) is amongst promising new computing scheme in the nano-scale regimes. As an emerging technology, QCA relies on radically different operations in its devices; for example, the logic values are represented by the position of electrons inside QCA cells rather than voltage levels, and the basic logic block of QCA is the majority voter. In this paper, we present the impact of scaling on defects that may arise in the manufacturing of QCA devices. This study shows how the sensitivity to manufacturing processing variations changes with device scaling. Scaling in QCA technology is related to cell dimension/size and cell-to-cell spacing within a Cartesian layout. Extensive simulation results on scaling of QCA devices, such as the majority voter, the inverter and the binary wire, are provided to show that defects have definitive trends in their behavior. These trends relate cell size (l) to the smallest cell-to-cell spacing (d) for erroneous behavior in the presence of different defects (such as misalignment and displacement); their impact on the correct functionality of QCA devices is extensively discussed. It is shown that in most defect cases the scaling relationship between l and d is linear, albeit with different slopes.

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Defects and faults in quantum cellular automata at nano scale

Abstract: There has been considerable research on quantum dot cellular automata (QCA)

Cited by 79 publications

References 12 publications

1-bit and 2-bit comparator designs and analysis for quantum-dot cellular automata

1-bit and 2-bit comparator designs and analysis for quantum-dot cellular automata

Error-Power Tradeoffs in QCA Design

Defect characterization for scaling of QCA devices

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