“…22 Traditional application of ion beams to electrochemical systems center on the use of Ga + FIBs for nanoscale milling or as part of transmission electron microscopy (TEM) sample preparation. Other battery-relevant work has used broad area implantation to increase adhesion between two dissimilar electrode layers 23 and to nanostructure the morphology of Ge electrodes in order to increase electrode capacity. 24 Broad area implantation using Li ions has been used to modify the electronic properties of Se nanowires 25 as well as to study amorphization and defects in Si.…”
mentioning
confidence: 99%
“…Other battery-relevant work has used broad area implantation to increase adhesion between two dissimilar electrode layers 23 and to nanostructure the morphology of Ge electrodes in order to increase electrode capacity. 24 Broad area implantation using Li ions has been used to modify the electronic properties of Se nanowires 25 as well as to study amorphization and defects in Si. 26 Initial tests using LiFIB implantation of Sn micro-spheres demonstrated the qualitative utility of the technique for lithiating battery-relevant materials and compared ion implantation directly to electrochemical lithiation of similar structures.…”
Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. To study the behavior of ion transport and reaction in these applications, we report the use of a focused ion beam of Li + to locally insert controlled quantities of lithium with high spatial-resolution into electrochemically relevant materials in vacuo. To benchmark the technique, we present results on direct-write lithiation of 35 nm thick crystalline silicon membranes using a 2 keV beam of Li + at doses up to 10 18 cm −2 (10 4 nm −2). We confirm quantitative sub-μm control of lithium insertion and characterize the concomitant morphological, structural and functional changes of the system using a combination of electron and scanning probe microscopy. We observe saturation of interstitial lithium in the silicon membrane at ≈ 10 % dopant number density and spillover of excess lithium onto the membrane's surface. The implanted Li + is demonstrated to remain electrochemically active. This technique will enable controlled studies and improve understanding of Li + ion interaction with local defect structures and interfaces in electrode and solid-electrolyte materials.
“…22 Traditional application of ion beams to electrochemical systems center on the use of Ga + FIBs for nanoscale milling or as part of transmission electron microscopy (TEM) sample preparation. Other battery-relevant work has used broad area implantation to increase adhesion between two dissimilar electrode layers 23 and to nanostructure the morphology of Ge electrodes in order to increase electrode capacity. 24 Broad area implantation using Li ions has been used to modify the electronic properties of Se nanowires 25 as well as to study amorphization and defects in Si.…”
mentioning
confidence: 99%
“…Other battery-relevant work has used broad area implantation to increase adhesion between two dissimilar electrode layers 23 and to nanostructure the morphology of Ge electrodes in order to increase electrode capacity. 24 Broad area implantation using Li ions has been used to modify the electronic properties of Se nanowires 25 as well as to study amorphization and defects in Si. 26 Initial tests using LiFIB implantation of Sn micro-spheres demonstrated the qualitative utility of the technique for lithiating battery-relevant materials and compared ion implantation directly to electrochemical lithiation of similar structures.…”
Electrochemical processes that govern the performance of lithium ion batteries involve numerous parallel reactions and interfacial phenomena that complicate the microscopic understanding of these systems. To study the behavior of ion transport and reaction in these applications, we report the use of a focused ion beam of Li + to locally insert controlled quantities of lithium with high spatial-resolution into electrochemically relevant materials in vacuo. To benchmark the technique, we present results on direct-write lithiation of 35 nm thick crystalline silicon membranes using a 2 keV beam of Li + at doses up to 10 18 cm −2 (10 4 nm −2). We confirm quantitative sub-μm control of lithium insertion and characterize the concomitant morphological, structural and functional changes of the system using a combination of electron and scanning probe microscopy. We observe saturation of interstitial lithium in the silicon membrane at ≈ 10 % dopant number density and spillover of excess lithium onto the membrane's surface. The implanted Li + is demonstrated to remain electrochemically active. This technique will enable controlled studies and improve understanding of Li + ion interaction with local defect structures and interfaces in electrode and solid-electrolyte materials.
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