1999
DOI: 10.1116/1.590734
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Defect reduction of ZnxCdyMg1−x−ySe based structures grown on InP by using Zn irradiation of the III–V surface

Abstract: Articles you may be interested inMgSe/ZnSe/CdSe coupled quantum wells grown on InP substrate with intersubband absorption covering 1.55 μm Appl. Phys. Lett. 105, 232107 (2014); 10.1063/1.4903823 Structural study of (CdS/ZnSe)/BeTe superlattices for λ=1.55 μm intersubband transition J. Appl. Phys. 95, 5352 (2004); 10.1063/1.1703833 Distributed Bragg reflectors based on (Zn, Cd, Mg)Se for use in the visible spectral range Distributed Bragg reflectors for visible range applications based on (Zn,Cd,Mg)Se lattice m… Show more

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Cited by 30 publications
(16 citation statements)
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(14 reference statements)
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“…The VI/II beam equivalent pressure ratio was about 3.5. This procedure has been shown to achieve epilayers with high crystalline quality and low defect density [4]. Thickness-calibration samples were grown during the same run.…”
Section: Experimental Details and Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The VI/II beam equivalent pressure ratio was about 3.5. This procedure has been shown to achieve epilayers with high crystalline quality and low defect density [4]. Thickness-calibration samples were grown during the same run.…”
Section: Experimental Details and Resultsmentioning
confidence: 99%
“…The details of the molecular beam epitaxy (MBE) system used and the growth of these II-VI materials were described elsewhere [4]. The MQW samples used in this work were grown on n-type InP (001) substrates and consisted of a lattice-matched InGaAs buffer layer (~0.1 µm), a ZnCdSe interfacial layer (~100 Å) and the II-VI MQW structures.…”
Section: Experimental Details and Resultsmentioning
confidence: 99%
“…A sequence of steps has previously been developed to initiate ZnCdSe growth on an InGaAs surface [18]. Upon completion of the InGaAs layer growth, the sample is transferred to the II-VI chamber where the As-terminated InGaAs surface is exposed to a zinc flux for 40 s at a temperature of 200 1C (Zn-irradiation).…”
Section: Methodsmentioning
confidence: 99%
“…[1]. The QW structure used in this work was grown on a semi-insulating InP (100) substrate and consisted of a lattice matched InGaAs buffer layer, a ZnCdSe interfacial layer (~70 Å), ZnCdMgSe (E 0 = 2.8 eV at RT) barriers and a QW of Zn 0.53 Cd 0.47 Se.…”
Section: Methodsmentioning
confidence: 99%