ICECS'99. Proceedings of ICECS '99. 6th IEEE International Conference on Electronics, Circuits and Systems (Cat. No.99EX357)
DOI: 10.1109/icecs.1999.813221
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Defect detection and classification on web textile fabric using multiresolution decomposition and neural networks

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Cited by 47 publications
(49 citation statements)
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“…(3) resolution of input image [19,[37][38][39][40][41]: e.g., a low resolution image cannot show fine defects in fabric; (4) alignment of input image [3,42,43]: e.g., misalignment in image acquisition induces false defect detection in template matching approach; (5) size [37,44], and shape [45][46][47] of defects: e.g., defect of small size or defect similar to a pattern shape increases difficulties in recognition; (6) speed or computation complexity of defect detection [37,48,49]: e.g., long learning delays may not be practical; (7) lighting [13]: e.g., improper illumination yields poor resolution and contrast; and (8) image acquisition techniques: e.g., most inspection methods use digital cameras to capture images. However, alternative approaches are also available, such as near-infrared (NIR) [50], X-ray, multispectral imaging and polarimetry, which may provide extra features in defect detection.…”
Section: Performance Metric For Defect Detectionmentioning
confidence: 99%
“…(3) resolution of input image [19,[37][38][39][40][41]: e.g., a low resolution image cannot show fine defects in fabric; (4) alignment of input image [3,42,43]: e.g., misalignment in image acquisition induces false defect detection in template matching approach; (5) size [37,44], and shape [45][46][47] of defects: e.g., defect of small size or defect similar to a pattern shape increases difficulties in recognition; (6) speed or computation complexity of defect detection [37,48,49]: e.g., long learning delays may not be practical; (7) lighting [13]: e.g., improper illumination yields poor resolution and contrast; and (8) image acquisition techniques: e.g., most inspection methods use digital cameras to capture images. However, alternative approaches are also available, such as near-infrared (NIR) [50], X-ray, multispectral imaging and polarimetry, which may provide extra features in defect detection.…”
Section: Performance Metric For Defect Detectionmentioning
confidence: 99%
“…Likewise NNs have been involved in the research of automated fabric defect inspection system. Many efforts have been given for auto mated fabric defect inspection [8,[17][18][19][20][21][22][23][24][25][26][27][28][29][30][31][32][33][34][35][36]. Most of them have focused on defect detection, where few of them have focused on classification.…”
Section: Literature Reviewmentioning
confidence: 99%
“…In both cases, they have used six types of defects. Karayiannis et al [20] have used seven types of defect. They have used statistical texture features.…”
Section: Literature Reviewmentioning
confidence: 99%
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