Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

Ley, Adam W

doi:10.1109/test.2009.5355828

“…Defects considered are expressed in the PCOLA-SOQ [1] score; this method assigns a coverage score to Presence, Correctness, Orientation, Liveliness, and Alignment properties of each device on the board and Short, Open, and Quality score to all the connections on the board. Many research papers on board-assembly testing focus on "non-intrusive" testing techniques [2] such as boundary scan tests [3] or processorcontrolled tests. However, such papers typically ignore that discrete components are often an indispensable part of a board design.…”

Section: Introductionmentioning

confidence: 99%

Automatic Generation of In-Circuit Tests for Board Assembly Defects

Schaaijk¹,

Spierings

²

,

Marinissen³

2018

2018 IEEE International Test Conference in Asia (ITC-Asia)

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DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights. • Users may download and print one copy of any publication from the public portal for the purpose of private study or research. • You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal. If the publication is distributed under the terms of Article 25fa of the Dutch Copyright Act, indicated by the "Taverne" license above, please follow below link for the End User Agreement:

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The Increasing Importance of Utilizing Non-intrusive Board Test Technologies for Printed Circuit Board Defect Coverage

Johnson¹

2018

2018 Ieee Autotestcon

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Automatic generation of in-circuit tests for board assembly defects

Schaaijk

¹

,

Spierings

²

,

Marinissen

³

2018

2018 IEEE 23rd European Test Symposium (ETS)

1

0

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DOI to the publisher's website. • The final author version and the galley proof are versions of the publication after peer review. • The final published version features the final layout of the paper including the volume, issue and page numbers. Link to publication General rights Copyright and moral rights for the publications made accessible in the public portal are retained by the authors and/or other copyright owners and it is a condition of accessing publications that users recognise and abide by the legal requirements associated with these rights. • Users may download and print one copy of any publication from the public portal for the purpose of private study or research. • You may not further distribute the material or use it for any profit-making activity or commercial gain • You may freely distribute the URL identifying the publication in the public portal. If the publication is distributed under the terms of Article 25fa of the Dutch Copyright Act, indicated by the "Taverne" license above, please follow below link for the End User Agreement:

show abstract

Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

Cited by 3 publications

References 3 publications

Automatic Generation of In-Circuit Tests for Board Assembly Defects

Automatic Generation of In-Circuit Tests for Board Assembly Defects

The Increasing Importance of Utilizing Non-intrusive Board Test Technologies for Printed Circuit Board Defect Coverage

Automatic generation of in-circuit tests for board assembly defects

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