2021
DOI: 10.1002/solr.202100181
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Defect Control for High‐Efficiency Cu2ZnSn(S,Se)4 Solar Cells by Atomic Layer Deposition of Al2O3 on Precursor Film

Abstract: Cu2ZnSn(S,Se)4 are emerging as promising photovoltaic materials due to their outstanding photoelectrical performances, benign grain boundaries, and Earth‐abundant constituent elements. However, there are largely distributed cation‐disordering defects and defect clusters, which lead to an increase in recombination and a large open‐circuit voltage deficit and thus deteriorate device performance. Herein, defect control for a high‐efficiency Cu2ZnSn(S,Se)4 solar cell by atomic layer deposition of aluminum oxide (A… Show more

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Cited by 24 publications
(28 citation statements)
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“…In a previous report by Sun et al, Al incorporation enhanced crystallization of spin-coated CZTSe films during the postselenization process. [15] However, this crystallization enhancement was not observed for the sprayed films in this study. The contradictory results regarding the Al incorporation effect may be attributed to the different deposition methods.…”
Section: Structural and Chemical Analysis Of Al-incorporated Cztsse A...contrasting
confidence: 57%
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“…In a previous report by Sun et al, Al incorporation enhanced crystallization of spin-coated CZTSe films during the postselenization process. [15] However, this crystallization enhancement was not observed for the sprayed films in this study. The contradictory results regarding the Al incorporation effect may be attributed to the different deposition methods.…”
Section: Structural and Chemical Analysis Of Al-incorporated Cztsse A...contrasting
confidence: 57%
“…Sun et al reported that Al 2 O 3 incorporation resulted in the conversion of Sn 2þ to Sn 4þ . [15] In our results, no noticeable difference is observed in the Sn 3d 5/2 spectra. Figure 4f shows the XPS spectra of Al 2p; the peak center is located at %74.6 eV, which is close to the Al 2p of Al 2 O 3 .…”
Section: Structural and Chemical Analysis Of Al-incorporated Cztsse A...supporting
confidence: 43%
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“…In our previous work, the effects of annealing conditions were studied systematically for the devices on the transparent F:SnO 2 (FTO) substrate, which suggests the combination of high temperature, short time, and higher amount of chalcogen through a rapid thermal annealing process is crucial to get high-quality film as well as preserve a good back interface characteristic [15]. Besides, using different elemental compositions, the performance of CZTSSe devices on Mo substrate has been investigated, suggesting that Zn rich, Cu, and Sn poor composition is beneficial to suppressing the formation of deep level defects [16][17][18][19][20]. However, Zn rich and Cu, Sn poor composition leads to Btype defect clusters, such as 2Zn Cu , Zn Sn , and Zn(S,Se) secondary phases in the CZTSSe film [18].…”
Section: Introductionmentioning
confidence: 99%