2016
DOI: 10.1088/0268-1242/32/1/015002
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Deep levels in high resistive CdTe and CdZnTe explored by photo-Hall effect and photoluminescence spectroscopy

Abstract: High resistive CdTe and CdZnTe single crystals were measured by photo-Hall effect spectroscopy (PHES) and photoluminescence spectroscopy (PL) with the aim of discovering the position of deep levels (DLs) in the band gap. Illumination in the range of 0.65-1.77 eV, room temperature, and DC electrical measurements were used in the case of PHES. Low temperature (4 K) photoluminescence spectra were recorded in the spectral range above 0.47 eV. Eight samples, both n-type and p-type, were studied and typical shapes o… Show more

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Cited by 10 publications
(16 citation statements)
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“…The measured photoconductivity in the sub-bandgap energy region is a few orders of magnitude lower than that observed in inorganic semiconductors [29,30,63,64] . The lower photoconductivity may indicate the low defect concentration in the range of 10 9 -10 12 cm -3 according to SRH simulations [30] .…”
Section: Deep Level Recombination Parametersmentioning
confidence: 84%
“…The measured photoconductivity in the sub-bandgap energy region is a few orders of magnitude lower than that observed in inorganic semiconductors [29,30,63,64] . The lower photoconductivity may indicate the low defect concentration in the range of 10 9 -10 12 cm -3 according to SRH simulations [30] .…”
Section: Deep Level Recombination Parametersmentioning
confidence: 84%
“…For this contribution, a single crystalline CdZnTe with a zinc content of 4.5 % grown by the vertical gradient freeze method at the Institute of Physics, Charles University was chosen. N-type sample with dimensions of 3x2x12 mm 3 prepared by a standard method 13 was used in the classic six-contact Hallbar shape convenient for galvanomagnetic measurements. The sample was distinguished by an unusual decrease of mobility, the appearance of negative differential photoconductivity (NDPC) and several…”
Section: Sample Properties and Photo-hall Effect Measurementsmentioning
confidence: 99%
“…The material quality strongly controls the price of the ingots 7 and further investigation and improvement of the material are therefore needed. The existing thermal emission spectroscopy methods suffer from known limitations when unambiguously identifying DLs properties, especially in case of very deep levels with trapping energy well above the half of the band gap energy 12,13 . In our previous paper 13 we showed that photo-Hall effect spectroscopy (PHES) is a convenient method for the complementary study of deep level properties.…”
Section: Introductionmentioning
confidence: 99%
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“…Low hole mobility and enhanced hole trapping reduce the charge collection efficiency (CCE) and produce long asymmetric tail at measured energy spectra (hole tailing). Thus, poor hole mobility-lifetime product (µ h τ h ) and relevant defect structure [7,9] are critical issues in the utilization of (CdZn)Te radiation detectors.…”
Section: Introductionmentioning
confidence: 99%