Decision support system for high temperature electronics

McCluskey, Patrick; Osterman, Michael; Jain, Ritika; Tiwari, Nayan K; Grzybowski, Richard; Tang, Lin; Benoit, J.

doi:10.1109/hitec.1998.676784

1998 Fourth International High Temperature Electronics Conference. HITEC (Cat. No.98EX145)

DOI: 10.1109/hitec.1998.676784

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Decision support system for high temperature electronics

Patrick McCluskey

Michael Osterman²,

Ritika Jain³

et al.

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“…The major elements limiting the use of standard commercial technology for high-temperature, high-power electronics are silicon devices, capacitors, solders, plastic encapsulants, printed wiring boards, and wire bond(McCluskey et al 1998a). For temperatures up to 135°C (275°F), standard commercial devices and packaging technologies can be used.…”

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Integrated PoF and CBM Strategies for Improving Electronics Reliability Performance of Downhole MWD and LWD Tools

et al. 2010

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Electronics that operate under downhole drilling conditions, such as printed circuit board assemblies (PCBAs) in measurementwhile-drilling (MWD)/logging-while-drilling (LWD) tools, can experience a significant amount of extremely high temperatures and vibration stresses over their lifetimes, which may induce failures during deployment. This study demonstrates the methodologies on integrated physics of failure (PoF) for improving the reliability performance of MWD/LWD tools.PoF discussed in this study is for identifying and understanding failure modes, failure mechanisms, and failure sites of drilling electronics for their particular life-cycle loading conditions. This PoF study is a systematic methodology, integrated with data acquisition technologies, conditional-based maintenance (CBM) and failure analysis techniques to actualize the real-time life management on improving maintenance decisions, and providing guidance to incorporate reliability into the well-planning and operation processes, thus enabling monetary savings for the oil company and the MWD/LWD service provider.Through data acquisition technologies, the drilling environmental profile is captured by the sensor and recorded in the memories of the MWD/LWD tool. Based on the drilling environmental profiles, the drilling stress and loading conditions are retrieved and calculated for estimating the remaining life of the drilling electronics. With CBM strategy, electronic units assessed with high risk results are excluded from being deployed to the field to avoid potential failure in the field. PoF is followed up to investigate the failure mechanism of units returned from field. Real-case studies on MWD/LWD tools operated onshore the U.S. and in the Asia Pacific region are presented.The objective of this study is to enable real-time electronics reliability assessment on MWD/LWD tools under their actual application conditions. When combined with PoF models, CBM strategy is capable of making continuously updated predictions on the remaining life of electronics based on the in-situ drilling environmental and operational conditions. IntroductionThe effectiveness of integrated PoF and CBM strategies could provide operational benefits through detecting and identifying the potential or early-stage electronics parts or system failures, and make the proactive repair or maintenance feasible. It will enable the field operations group to have capability to avoid downhole tool failures at the rig site, therefore reducing risk of failure and subsequently reducing associated costs.Compared to wireline applications, the LWD/MWD operation requires closer field control of downhole dynamics. From the sub level to individual PCBA level, use of a tracking system is highly recommended. This approach will make the real-time life management of LWD/MWD tools feasible through the remaining life calculation from bottom level to system level.Until now, to ensure the reliability performance of LWD/MWD tools, planned maintenance (PM) was adopted as the method for determining maintenanc...

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Integrated PoF and CBM Strategies for Improving Electronics Reliability Performance of Downhole MWD and LWD Tools

et al. 2010

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Decision support system for high temperature electronics

Cited by 1 publication

References 4 publications

Integrated PoF and CBM Strategies for Improving Electronics Reliability Performance of Downhole MWD and LWD Tools

Integrated PoF and CBM Strategies for Improving Electronics Reliability Performance of Downhole MWD and LWD Tools

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