Deadtime correction in counting rapidly decaying sources

Porges, K.G.; Volpi, A. De

doi:10.1016/0020-708x(71)90024-x

Cited by 9 publications

(2 citation statements)

References 15 publications

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“…It is seen that the Pechiney sample had the lowest heavy rareearths content while the Ames Laboratory specimen was purest with reference to the light rare earths. The XEOF observations on purity were substantiated by spark source mass spectroscopy employing electrical methods of detection (20).…”

Section: Analytical Studiesmentioning

confidence: 99%

X-ray excited optical fluorescence of trace rare earths in yttrium phosphate and yttrium vanadate hosts. Part per giga level determination of rare earth impurities in yttrium oxide

D’Silva¹,

Fassel²

1973

Anal. Chem.

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Y203 is a common starting material for the preparation of various solid-state luminescent materials. Since the luminescent efficiency of these materials may be adversely affected by the presence of ultratrace rareearth impurities, there has existed a pressing need for an analytical technique capable of assessing the purity of Y203. A comparative evaluation of the X-ray excited optical fluorescence spectra of various yttrium-containing compounds has revealed that YP04 and isostructural YV04 are superior hosts for the ultratrace determination of the Ce to Yb series of impurities occurring at the part per giga (1 in 101 23456789) level in highly purified YA.The unique optical fluorescent spectra of rare-earth activated materials has found widespread application in diverse industrial products such as solid state lasers (YAGNd), color television tubes (Y202S-Eu), and image conversion devices (Yi_zYbz02S • Er) (7). The efficiency of these materials, which are often compounds of yttrium, may be dependent on the presence of rare-earth impurities at the part per million levels because they may contribute to energy transfer processes (2-4). As a consequence, there is a pressing need for the preparation of ultra high purity Y2Os specially free from rare-earth impurities and for the development of sensitive analytical techniques to match these developments. The latter requirement has only recently been met by two simple but sensitive analytical techniques that take advantage of spectrometric methods of detection of the optical line fluorescence of rare-earth impurities excited by electrons, i.e., cathodoluminescence (5-7) or by X-rays (8-11), hereafter referred to as X-ray excited optical fluorescence (XEOF).Our own investigations with the XEOF technique have shown that quantitative results at the fractional ppm level or

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Section: Analytical Studiesmentioning

confidence: 99%

X-ray excited optical fluorescence of trace rare earths in yttrium phosphate and yttrium vanadate hosts. Part per giga level determination of rare earth impurities in yttrium oxide

D’Silva¹,

Fassel²

1973

Anal. Chem.

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“…Some studies have performed the analysis of short-lived time dependent source [ 6 , 7 ] but limited to the case of a well know shape dependency, for example in the case of decaying source with a single decay constant λ as n ( t ) dt = ( b + s 0 e − λt ) dt , where n is the time dependent event rate, b is the constant background rate, s 0 is the starting pulse rate. Nevertheless there are many different types of source and many case in which such sources are mixed together in a non predetermined way or have a non predetermined shape.…”

Section: Introductionmentioning

confidence: 99%

Generalization of DT Equations for Time Dependent Sources

Neri

Tudisco

Musumeci

et al. 2010

Sensors

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New equations for paralyzable, non paralyzable and hybrid DT models, valid for any time dependent sources are presented. We show how such new equations include the equations already used for constant rate sources, and how it’s is possible to correct DT losses in the case of time dependent sources. Montecarlo simulations were performed to compare the equations behavior with the three DT models. Excellent accordance between equations predictions and Montecarlo simulation was found. We also obtain good results in the experimental validation of the new hybrid DT equation. Passive quenched SPAD device was chosen as a device affected by hybrid DT losses and active quenched SPAD with 50 ns DT was used as DT losses free device.

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The radioanalytical bibliography of USA (1936–1977)

Nadkarni

1981

J. Radioanal. Chem.

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Deadtime correction in counting rapidly decaying sources

Cited by 9 publications

References 15 publications

X-ray excited optical fluorescence of trace rare earths in yttrium phosphate and yttrium vanadate hosts. Part per giga level determination of rare earth impurities in yttrium oxide

X-ray excited optical fluorescence of trace rare earths in yttrium phosphate and yttrium vanadate hosts. Part per giga level determination of rare earth impurities in yttrium oxide

Generalization of DT Equations for Time Dependent Sources

The radioanalytical bibliography of USA (1936–1977)

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