Thirteenth International Symposium on Quality Electronic Design (ISQED) 2012
DOI: 10.1109/isqed.2012.6187559
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DDRO: A novel performance monitoring methodology based on design-dependent ring oscillators

Abstract: Abstract-As CMOS technology scales, circuit performance becomes more sensitive to manufacturing and environmental variations. Hence, there is a need to measure or monitor circuit performance during manufacturing and at runtime. Since each circuit may have different sensitivities to process variations, previous works have focused on synthesis of circuit performance monitors that are specific to a given design. In this work, we study the potential benefit of having multiple design-dependent monitors. We develop … Show more

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Cited by 38 publications
(20 citation statements)
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“…Such structures are inserted (in a sparse manner) to capture hardware characteristics of interest. Several examples exist in the literature to monitor various circuit characteristics (e.g., achievable frequency [23], leakage power [24], or aging [25]). The challenge is to minimize the overheads introduced by the monitoring circuits; these overheads take the form of area, delay, and/or power, as well as design complexity while retaining accuracy.…”
Section: B Runtime Sensing Methodsmentioning
confidence: 99%
“…Such structures are inserted (in a sparse manner) to capture hardware characteristics of interest. Several examples exist in the literature to monitor various circuit characteristics (e.g., achievable frequency [23], leakage power [24], or aging [25]). The challenge is to minimize the overheads introduced by the monitoring circuits; these overheads take the form of area, delay, and/or power, as well as design complexity while retaining accuracy.…”
Section: B Runtime Sensing Methodsmentioning
confidence: 99%
“…We can also use D U of M (tm i ) instead of Dwc(tm i ), which would require only two STA runs as explained in Sec. III-B, and reduce presilicon computation at the cost of accuracy 3 . The knowledge of the nearcritical paths of the CUT under the worst-case workload is also available from the presilicon analysis.…”
Section: Post-silicon Aging Estimationmentioning
confidence: 99%
“…Methods as in [3] or [4] can also be applied to synthesize a replica-like path to reduce the margin for delay mismatch due to global variation.…”
Section: A Monitor Coverage and Delay Marginmentioning
confidence: 99%
“…Canary or replica circuits [2], [3] are stand-alone circuits which are intended to mimic the timing behavior of the original circuits. The delay of the real circuit can be estimated through measuring delay of the replicas.…”
Section: Introductionmentioning
confidence: 99%
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