2013
DOI: 10.1109/tcad.2012.2223467 View full text |Buy / Rent full text
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Abstract: Abstract-Microelectronic circuits exhibit increasing variations in performance, power consumption, and reliability parameters across the manufactured parts and across use of these parts over time in the field. These variations have led to increasing use of overdesign and guardbands in design and test to ensure yield and reliability with respect to a rigid set of datasheet specifications. This paper explores the possibility of constructing computing machines that purposely expose hardware variations to various … Show more

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