Abstract:The monolithic integration of extended short-wave infrared (e-SWIR) photodetectors (PDs) on silicon is highly sought-after to implement manufacturable, cost-effective sensing and imaging technologies. With this perspective, GeSn PIN PDs have been the subject of extensive investigations because of their bandgap tunability and silicon compatibility. However, due to growth defects, these PDs suffer a relatively high dark current density as compared to commercial III-V PDs. Herein, we elucidate the mechanisms gove… Show more
“…43. 154,155 Sn incorporation causes the shrinking of the optical bandgap of the GeSn compound. This is due to the shallow levels in which the populated charge carriers can be easily thermally activated, causing thermally-induced reverse dark current.…”
“…43. 154,155 Sn incorporation causes the shrinking of the optical bandgap of the GeSn compound. This is due to the shallow levels in which the populated charge carriers can be easily thermally activated, causing thermally-induced reverse dark current.…”
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