Damage of zeolite Y in the TEM and its effects on TEM images

Csencsits, R.; Gronsky, R.

doi:10.1016/0304-3991(87)90253-1

Cited by 68 publications

(30 citation statements)

References 11 publications

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“…We successfully reproduced the experimental result, and all the results are consistent with the pseudo-cristobalite model, as shown in the supplemental material 18 zeolites. 27 This experimental result suggests that the crystalline transition layer is metastable, which is consistent with the results of X-ray diffraction studies, in which the residual order was found to be reduced by heat treatment. 28 This is why the present metastable crystal has not been previously revealed by electron microscopy.…”

confidence: 80%

Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate

et al. 2012

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A silicon dioxide film on a silicon substrate is the most essential element in semiconductor devices and various advanced materials. We have elucidated the atomic structure of SiO2 films using low-dose scanning transmission electron microscopy (STEM). We have visualized a metastable crystalline SiO2 layer near a silicon substrate, which was not revealed in previous studies probably due to the vitrification caused by electron irradiation. Our experimental results also suggest a crystallographic nature of various surface oxides.

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confidence: 80%

Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate

et al. 2012

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“…In studies of zeolites and a-quartz, radiolysis was postulated to be the primary damage mechanism based on their increasing resistance to damage with accelerating voltage~Das & Mitchell, 1974;Hobbs & Pascucci, 1980;Pascucci et al, 1983;Csencsits & Gronsky, 1987;Inui et al, 1990;Yokota et al, 1994!. In their study of a-quartz, Hobbs and Pascuccĩ 1980! When s r and s kd are of the same order of magnitude, as they are for Al in a zeolite structure~Csencsits & Gronsky, 1987!, neither mechanism can be rejected using this simple argument.…”

Section: Possible Mechanisms Of Beam Damagementioning

confidence: 99%

Electron Radiation Damage of MCM-41 and Related Materials

Blanford

Carter

2003

Microsc Microanal

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The article compares the relative stability of MCM-41 and related mesoporous materials in electron beam at an accelerating voltage of 100-300 kV. The work encountered in electron microscopy presents a comparison with similar research that has been carried out on nonporous and microporous silicates, especially a-quartz and zeolite Y. The trends in stability are analyzed, classifying the effects of sample preparation, organic and inorganic moieties, and electron accelerating voltage on beam stability. A higher synthesis temperature, the use of an acid catalyst in the synthesis, and the presence of additional organic or inorganic material within the channels were all found to stabilize these materials. The dose required to completely disrupt the structure increased with accelerating voltage for nearly all samples, suggesting a primarily radiolytic damage mechanism.The exception, MCM-41 containing nanometer-sized titania particles in its channels, was found to be almost insensitive to accelerating voltage.

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“…On the other hand, although lower accelerating voltage is advantageous in efficiency of electron detection, it will work disadvantageously in electron irradiation damage. Since the damage process of zeolites proceeds dominantly not by knock-on process but by radiolysis in the range of practical accelerating voltage, 23,24 lower accelerating voltage makes a damage rate increase. Taking both detection efficiency and damage rate into consideration, the accelerating voltage of 200 kV…”

Section: Methodsmentioning

confidence: 99%

High-resolution imaging of zeolite with aberration-corrected transmission electron microscopy

2013

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We demonstrated high-resolution imaging of atomic columns in zeolite frameworks with spherical aberration-corrected transmission electron microscopy(AC-HRTEM). An MFI-type zeolite was observed by AC-HRTEM with optimized optical setup. Compared with the conventional imaging mode based on a positive spherical aberration, the negative spherical aberrationimaging (NCSI) mode sharpened image contrasts at atomic column positions. The projected atomic columns of zeolite are so complex that sharp image contrast can help to distinguish each atomic column position.

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Damage of zeolite Y in the TEM and its effects on TEM images

Cited by 68 publications

References 11 publications

Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate

Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate

Electron Radiation Damage of MCM-41 and Related Materials

High-resolution imaging of zeolite with aberration-corrected transmission electron microscopy

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