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2010
DOI: 10.1016/j.jcrysgro.2010.05.045
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Czochralski-growth of germanium crystals containing high concentrations of oxygen impurities

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Cited by 21 publications
(11 citation statements)
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“…4, no absorption peaks were observed at 1106 cm −1 related to the ν 3 stretching mode of SiOSi quasi-molecules in any of the infrared spectra. In addition, no peaks were also observed at 1225 cm −1 related to SiO 2 precipitates [17]. These indicate that SiO-related defects were lower than the detection limit for all the Ge crystals.…”
mentioning
confidence: 80%
“…4, no absorption peaks were observed at 1106 cm −1 related to the ν 3 stretching mode of SiOSi quasi-molecules in any of the infrared spectra. In addition, no peaks were also observed at 1225 cm −1 related to SiO 2 precipitates [17]. These indicate that SiO-related defects were lower than the detection limit for all the Ge crystals.…”
mentioning
confidence: 80%
“…In literature, the pulling rates used for Germanium crystal growth varies greatly from 0.16 -1.5 mm/min. This wide process interval is mainly due to the significant influences that other parameters have on the growth rate and to which diameter the crystal has been grown [35] [50] [51]…”
Section: C Curtolo Et Al Journal Of Crystallization Process and mentioning
confidence: 99%
“…Detailed conditions for the evaluation have been reported previously [23]. Figure 4 shows precipitates, in any of the infrared spectra [23].…”
Section: Growth Of Ge Crystals From a Melt Fully Covered By Liquid B mentioning
confidence: 99%