Cylindrical ultrasonic linear microactuator based on quasi-traveling wave propagation on a thin film metallic glass pipe supported by a piezoelectric ceramic tube

Sun, Dongming; Wang, Sheng; Hata, Seiichi; Sakùrai, Jun; Shimokohbe, Akira

doi:10.1016/j.sna.2009.10.004

Cited by 7 publications

(2 citation statements)

References 24 publications

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“…Additionally there have been rapid strides in using Pd based thin film metallic glasses (TFMGs) for piezoelectric ultrasound motors, micro actuators and sensors, [4][5][6][7] and as the basic building blocks of microelectromechanical systems (MEMS) and nanoelectromechanical systems (NEMS) [8,9]. In particular the technological and scientific significance of the Pd-Cu-Ni-P system has resulted in systematic structural and physical elucidation by different pioneering groups with current studies as recent as 2012 [10][11][12][13][14][15][16][17][18][19][20][21][22].…”

Section: Introductionmentioning

confidence: 99%

Glass transition temperature of Pd–Cu–Ni–P thin film metallic glass—a 2D approach

Chakrabarti

Chaudhuri

Kanjilal

2013

Journal of Non-Crystalline Solids

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Section: Introductionmentioning

confidence: 99%

Glass transition temperature of Pd–Cu–Ni–P thin film metallic glass—a 2D approach

Chakrabarti

Chaudhuri

Kanjilal

2013

Journal of Non-Crystalline Solids

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“…Bulk Metallic Glasses (BMG) have recently been incorporated in high-performance applications at the macroscale [1,2] and at the fine scale [3], as well as in two-phase (crystal/glass) microstructures [4]. BMGs have strengths approaching theoretical limits, very high hardness and elastic limits [5].…”

Section: Introductionmentioning

confidence: 99%

Mapping Residual-Stress Distributions in a Laser-Peened Vit-105 Bulk-Metallic Glass Using the Focused-Ion-Beam Micro-Slitting Method

et al. 2011

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Measuring residual-stresses at the micron scale in glassy materials imposes experimental challenges, particularly when using diffraction, or other conventional laboratory methods, e.g., optical non-contact methods, grid methods, etc. In this short paper, a technique for mapping residual-stress profiles in amorphous materials with high spatial definition is used to measure residual-stresses in a laser-peened and fatigued bulk-metallic glass -Vit-105. The method involves local deposition of nano Pt dots patterns on the mapped region of the specimen and milling of a series of micro-slots of size 15 × 2 × 0.4 µm 3 using the focused ion beam of a dual beam Field Emission Gun Scanning Electron Microscope / Focused Ion Gun (FEGSEM/FIB) instrument. The deformation fields in the vicinity of slots are reconstructed by the digital image correlation analyses (DICA) of FEGSEM images recorded during milling. The residual-stresses are inferred by fitting a reference displacement field obtained from finite-element analyses (FEA) with the recorded displacement field. In this way, residual-stress distributions have been characterized as a function of the distance from the laser-peened surface to a depth of 1,200 microns with a spatial resolution of 30 µm. The influence of fatigue loading on the compressive residual-stresses spatial distribution is studied and discussed. It was found that the fatigue loading significantly changes the compressive residual-stress spatial distribution in the laserpeened layer.

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Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting

et al. 2012

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Cylindrical ultrasonic linear microactuator based on quasi-traveling wave propagation on a thin film metallic glass pipe supported by a piezoelectric ceramic tube

Cited by 7 publications

References 24 publications

Glass transition temperature of Pd–Cu–Ni–P thin film metallic glass—a 2D approach

Glass transition temperature of Pd–Cu–Ni–P thin film metallic glass—a 2D approach

Mapping Residual-Stress Distributions in a Laser-Peened Vit-105 Bulk-Metallic Glass Using the Focused-Ion-Beam Micro-Slitting Method

Submicron-scale depth profiling of residual stress in amorphous materials by incremental focused ion beam slotting

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