Noise power spectra of semiconducting CdS are measured in the range between 10 and 106 Hz for temperatures from 83 to 323 K. The spectra which can be fitted by a sum of terms AK/[1 + (2πfτK)2] (f. frequency) are characteristic of generation‐recombination noise. From the amplitudes AK as well as from the time constants τK in dependence on the temperature, the energetic positions, the concentrations, and the recombination coefficients for the capture of electrons of four different defect levels are determined. Their energetic positions are 0.07, 0.14, 0.23, and 0.46 eV below the conduction band. The concentrations are in the range of 5 × 1011 to 5 × 1013 cm−3. These low concentrations agree with those measured recently by a quasi‐Fermi level analysis of the photocurrent decay on high‐resistivity photoconducting CdS.