1977
DOI: 10.1002/pssa.2210440125
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Analysis of localized levels in semiconducting CdS from generation–recombination noise spectra

Abstract: Noise power spectra of semiconducting CdS are measured in the range between 10 and 106 Hz for temperatures from 83 to 323 K. The spectra which can be fitted by a sum of terms AK/[1 + (2πfτK)2] (f. frequency) are characteristic of generation‐recombination noise. From the amplitudes AK as well as from the time constants τK in dependence on the temperature, the energetic positions, the concentrations, and the recombination coefficients for the capture of electrons of four different defect levels are determined. T… Show more

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Cited by 22 publications
(8 citation statements)
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“…These number fluctuations of conducting charge carriers may cause the Lorentzian shaped g-r noise contributions in the spectrum. Several authors [16][17][18] have measured g-r noise of discrete impurity level systems as a function of temperature and have estimated the energy position in the forbidden band. In the case of our diamond specimen the hard gap width is so narrow that carriers can be easily transferred across the hard gap with help of thermal energy.…”
Section: Introductionmentioning
confidence: 99%
“…These number fluctuations of conducting charge carriers may cause the Lorentzian shaped g-r noise contributions in the spectrum. Several authors [16][17][18] have measured g-r noise of discrete impurity level systems as a function of temperature and have estimated the energy position in the forbidden band. In the case of our diamond specimen the hard gap width is so narrow that carriers can be easily transferred across the hard gap with help of thermal energy.…”
Section: Introductionmentioning
confidence: 99%
“…In many experiments on 1/f noise in semiconductors, a hump in the high frequency region is observed [28][29][30] which usually is interpreted as a g-r noise level due to some additional impurity center [31]. The present model suggests that such a hump may also be interpreted as "g-r burst noise".…”
Section: /F Noise Due To Atomic Diffusion Of Impurity Centers L217mentioning
confidence: 66%
“…Hooge coefficient due to mobile defects in (31) ionization energy of X-centers ∆E def local variation of E X in presence of defects next to a fixed X-center f frequency f bn cut-off frequency of burst noise (see Fig. 6) f c corner frequency where 1/f noise is equal to g-r noise (see Fig.…”
Section: /F Noise Due To Atomic Diffusion Of Impurity Centers L217mentioning
confidence: 99%
“…Integrating the specific heat capacity (38) and (35) shows that the molar energy, E D T ð Þ, increases as T 4 at low temperatures and as T in the high temperature range, whereas the entropy increases as T 3 in the low temperature interval and as 'n T=T D ð Þ in the high temperature region. The molar thermal energy E D T ð Þ and entropy S D T ð Þ illustrate these qualitative expectations, Figure 14.…”
Section: Energy Of Vibrations and The Number Of Phonons As An Examplementioning
confidence: 99%
“…The continuous transfer and exchange of energy between the microstates causes inevitably fluctuations around the thermal equilibrium values of the occupancies. They show up as the many sources of fluctuations and noise in thermal equilibrium, such as generation-recombination noise in semiconductors as an example [34][35][36].…”
Section: The Entropy Of Phonons As Mixing Entropy Of Bosonsmentioning
confidence: 99%