Current measurement on MeV energy ion beams

Pászti, F.; Manuaba, A.; Hajdu, C.; Melo, A.A.; Silva, M.F. Da

doi:10.1016/0168-583x(90)90028-s

Cited by 104 publications

(27 citation statements)

References 57 publications

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“…An ion current of typically 8 nA as measured by a transmission Faraday cup [7] was used. The spectra taken on the sample were simulated with the same layer structure using the RBX program [8].…”

Section: Methodsmentioning

confidence: 99%

Hydrogenation of FeCoZr–Al2O3 nanocomposites studied by Mössbauer spectroscopy and magnetometry

Saad

Kasiuk²,

Fedotova³

et al. 2009

Hyperfine Interact

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Hydrogenation effects on crystalline and magnetic structure of nanocomposites (FeCoZr) x (Al 2 O 3 ) 100−x , 38 ≤ x ≤ 63 at.% are studied by 57 Fe Mössbauer spectroscopy and magnetometry. Variations of local structure, blocking temperature and mean FeCoZr nanoparticles' volume are discussed with respect to (i) composition and (ii) two competing processes-H 2 incorporation and annealing-occurred during treatment in H 2 plasma.

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Section: Methodsmentioning

confidence: 99%

Hydrogenation of FeCoZr–Al2O3 nanocomposites studied by Mössbauer spectroscopy and magnetometry

Saad

Kasiuk²,

Fedotova³

et al. 2009

Hyperfine Interact

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“…The collected charge is determined by a transmission Faraday cup [75], although in this analysis the charge.solidangle product QΩ is determined directly from the a-Si signals. However, the nominal charge agreed with the value of QΩ determined from the spectra at 0.7%.…”

Section: Measurementsmentioning

confidence: 99%

Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

2012

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Ion beam analysis (IBA) is a cluster of techniques including Rutherford and non-Rutherford backscattering spectrometry, and particle-induced X-ray emission (PIXE). Recently, the ability to treat multiple IBA techniques (including PIXE) self-consistently has been demonstrated. The utility of IBA for accurately depth profiling thin films is critically reviewed. As an important example of IBA, three laboratories have independently measured a silicon sample implanted with a fluence of nominally 5.1015As/cm2 at an unprecedented absolute accuracy. Using 1.5 MeV 4He+ Rutherford backscattering spectrometry (RBS), each lab has demonstrated a combined standard uncertainty around 1% (coverage factor k=1) traceable to an Sb-implanted certified reference material through the silicon electronic stopping power. The uncertainty budget shows that this accuracy is dominated by the knowledge of the electronic stopping, but that special care must also be taken to accurately determine the electronic gain of the detection system and other parameters. This RBS method is quite general and can be used routinely, to accurately validate ion implanter charge collection systems, to certify SIMS standards, and for other applications. The generality of application of such methods in IBA is emphasised: if RBS and PIXE data are analysed self-consistently then the resulting depth profile inherits the accuracy and depth resolution of RBS and the sensitivity and elemental discrimination of PIXE

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“…[27] , while the beam divergence was kept below 0.06°. Typically, a beam current of 20 nA was measured by transmission Faraday cup [28]. Backscattered He + and H + ions were detected using an ORTEC surface barrier detector mounted in the Cornell geometry at a scattering angle of  = 165°.…”

Section: Methodsmentioning

confidence: 99%

Nondestructive atomic compositional analysis of BeMgZnO quaternary alloys using ion beam analytical techniques

Zolnai

Toporkov

Volk

et al. 2015

Applied Surface Science

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HighlightsBeMgZnO thin layers were grown with plasma assisted molecular beam epitaxy (MBE)The Be contents were accurately measured with RBS and proton elastic backscattering The Tauc bandgap was measured from optical transmittance experiments The bandgap has been varied between 3.26 eV and 4.62 eV via the Be and Mg content Experimental and density functional theory calculated bandgaps were in good agreement AbstractThe atomic composition with less than 1-2 atom % uncertainty was measured in ternary BeZnO and quaternary BeMgZnO alloys using a combination of nondestructive Rutherford backscattering spectrometry with 1 MeV He + analyzing ion beam and nonRutherford elastic backscattering experiments with 2.53 MeV energy protons. An enhancement factor of 60 in the cross-section of Be for protons has been achieved to monitor Be atomic concentrations. Usually the quantitative analysis of BeZnO and BeMgZnO systems is challenging due to difficulties with appropriate experimental tools for the detection of the light Be element with satisfactory accuracy. As it is shown, our applied ion beam technique, Page 2 of 22A c c e p t e d M a n u s c r i p t supported with the detailed simulation of ion stopping, backscattering, and detection processes allows of quantitative depth profiling and compositional analysis of wurtzite BeZnO/ZnO/sapphire and BeMgZnO/ZnO/sapphire layer structures with low uncertainty for both Be and Mg. In addition, the excitonic bandgaps of the layers were deduced from optical transmittance measurements. To augment the measured compositions and bandgaps of BeO and MgO co-alloyed ZnO layers, hybrid density functional bandgap calculations were performed with varying the Be and Mg contents. The theoretical vs. experimental bandgaps show linear correlation in the entire bandgap range studied from 3.26 eV to 4.62 eV. The analytical method employed should help facilitate bandgap engineering for potential applications, such as solar blind UV photodetectors and heterostructures for UV emitters and intersubband devices.

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Current measurement on MeV energy ion beams

Cited by 104 publications

References 57 publications

Hydrogenation of FeCoZr–Al2O3 nanocomposites studied by Mössbauer spectroscopy and magnetometry

Hydrogenation of FeCoZr–Al2O3 nanocomposites studied by Mössbauer spectroscopy and magnetometry

Accurate Determination of Quantity of Material in Thin Films by Rutherford Backscattering Spectrometry

Nondestructive atomic compositional analysis of BeMgZnO quaternary alloys using ion beam analytical techniques

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