Current-induced switching of thin film 
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 devices imaged using a scanning single-spin microscope

Guo, Qiaochu; D'Addario, Anthony; Cheng, Yang; Kline, Jeremy; Gray, Isaiah; Cheung, Hil Fung Harry; Yang, Fengyuan; Nowack, Katja C.; Fuchs, Gregory D.

doi:10.1103/physrevmaterials.7.064402

Phys. Rev. Materials

2023

DOI: 10.1103/physrevmaterials.7.064402

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Current-induced switching of thin film α−Fe2O3 devices imaged using a scanning single-spin microscope

Qiaochu Guo

Anthony D'Addario

Yang Cheng

et al.

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Single spin magnetometry and relaxometry applied to antiferromagnetic materials

Finco,

Jacques

2023

APL Materials

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Despite the considerable interest for antiferromagnets that appeared with the perspective of using them for spintronics, their experimental study, including the imaging of antiferromagnetic textures, remains a challenge. To address this issue, quantum sensors, and, in particular, the nitrogen-vacancy (NV) defects in diamond have become a widespread technical solution. We review here the recent applications of single NV centers to study a large variety of antiferromagnetic materials, from quantitative imaging of antiferromagnetic domains and non-collinear states, to the detection of spin waves confined in antiferromagnetic textures and the non-perturbative measurement of spin transport properties. We conclude with recent developments improving further the magnetic sensitivity of scanning NV microscopy, opening the way to detailed investigations of the internal texture of antiferromagnetic objects.

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Single spin magnetometry and relaxometry applied to antiferromagnetic materials

Finco,

Jacques

2023

APL Materials

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Current-induced switching of thin film α−Fe2O3 devices imaged using a scanning single-spin microscope

Cited by 1 publication

References 42 publications

Single spin magnetometry and relaxometry applied to antiferromagnetic materials

Single spin magnetometry and relaxometry applied to antiferromagnetic materials

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