1990
DOI: 10.1109/16.43832
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Current gain enhancement effect by gate doping in bipolar-mode field-effect transistor

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Cited by 12 publications
(4 citation statements)
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“…1. The device parameters (P + -gate junction depth, epilayer thickness and its doping, channel width, source, drain and P + gate peak doping) are chosen based on reported results in literature [12][13][14][15] and are tabulated in Table I the Schottky gate to inject excess holes into the N-drift region [32]. When the drain voltage is increased to V DS = 5 V at I G = 0.4 μA/μm, the holes are pushed deeper towards the source making the low resistance conductivity modulated region shorter as shown in Fig.…”
Section: Bipolar Mode Operation Of Schottky Gatementioning
confidence: 99%
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“…1. The device parameters (P + -gate junction depth, epilayer thickness and its doping, channel width, source, drain and P + gate peak doping) are chosen based on reported results in literature [12][13][14][15] and are tabulated in Table I the Schottky gate to inject excess holes into the N-drift region [32]. When the drain voltage is increased to V DS = 5 V at I G = 0.4 μA/μm, the holes are pushed deeper towards the source making the low resistance conductivity modulated region shorter as shown in Fig.…”
Section: Bipolar Mode Operation Of Schottky Gatementioning
confidence: 99%
“…1. The device parameters (P + -gate junction depth, epilayer thickness and its doping, channel width, source, drain and P + gate peak doping) are chosen based on reported results in literature [12][13][14][15] and are tabulated in Table I. Two-dimensional numerical simulations were performed In order to understand the physics of the device, particularly the effect of Schottky interface, energy band diagrams of the Metal gate-N epilayer junction simulated using MEDICI are shown in Fig.…”
Section: Bipolar Mode Operation Of Schottky Gatementioning
confidence: 99%
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