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The temperature dependence of the thermo-optic coefficient for crystalline silicon has been measured in the temperature range between room temperature and 550 K at the wavelength of 1523 nm by means of an interferometric technique. This technique, which requires a very simple experimental setup, is based on the observation of the fringe pattern produced by temperature changes in a Fabry–Perot resonator. Measurement results indicate that the thermo-optic coefficient is independent on the sample doping and crystal plane orientation. The experimental data appear to be in agreement with the few values reported to date at this important wavelength. The temperature dependence of the excitonic band gap is also calculated by fitting these data with a recently introduced model of ∂n/∂T.

The thermo-optic coefficient ∂n/∂T has been measured from room temperature to 600 K at the wavelength of 1523 nm in three important semiconductors for fiber-optic device fabrication, namely, InP, GaAs, and 6H–SiC. The adopted technique is very simple and is based on the observation of the periodicity of the signal transmitted, at the desired wavelength, by an étalon made of the material under test, when it experiences a temperature variation. The values of ∂n/∂T measured in InP and GaAs at room temperature are in agreement with previously reported ones, but increase with temperature with a weak quadratic dependence. SiC conversely shows a lower thermo-optic coefficient (2.77×10−5 K−1) at 300 K, which, however, doubles for a 300 K temperature increase.

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