Current and Future Energy Dispersive EXAFS Detector Systems

Derbyshire, G.E.; Helsby, W.; Dent, A. J.; Wright, Steven A.; Farrow, R. C.; Greaves, G.N.; Morrell, C.; Baker, Gareth J.

doi:10.1154/s0376030800014452

Adv. x-ray anal.

1990

DOI: 10.1154/s0376030800014452

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Current and Future Energy Dispersive EXAFS Detector Systems

G.E. Derbyshire

W. Helsby

A. J. Dent

et al.

Abstract: This paper presents a review of the current status of photodiode array systems adapted for Energy Dispersive EXAFS (EDE) using a synchrotron radiation source. The performance of a conventional Reticon PDA is compared with that of a hybrid CCD. The specification of a new detector system for EDE is discussed in the light of experience gained with current linear detectors.

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Absorption Techniques inX‐Ray Spectrometry

Kawai

2000

Encyclopedia of Analytical Chemistry

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X‐ray absorbance depends on the wavelength of the X‐rays, atomic number, chemical environment, and concentration of analyte. X‐ray absorption spectrometry is a technique for analyzing the chemical environment of an element in an unknown material. This method is closely related to photoelectron spectroscopy, Auger electron spectroscopy, and X‐ray fluorescence spectroscopy. Chemical information in the chemical shift and line shape of XANES (X‐ray absorption near‐edge structure) spectra is described. The history and theory of EXAFS (extended X‐ray absorption fine structure) are discussed in relation to other experimental techniques. Data analysis methods, databases, software packages, instrumentation, and synchrotron radiation facilities for X‐ray absorption analysis are overviewed. Alternative methods such as electron energy loss spectroscopy (EELS), self‐absorption effect, extended X‐ray emission fine structure (EXEFS), X‐ray Raman scattering, diffraction anomalous fine structure (DAFS), β‐environment fine structure (BEFS), and inverse photoemission spectroscopy (IPES) are also described.

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Absorption Techniques inX‐Ray Spectrometry

Kawai

2000

Encyclopedia of Analytical Chemistry

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<title>Combined x-ray absorption spectroscopy and x-ray powder diffraction</title>

et al. 1991

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The complementary nature of x-ray absorption fine structure (XAFS) spectroscopy and x-ray diffraction (XRD) is described. In particular XAFS records the local structure whilst XRD detects the long range crystallinity enabling the heterogeneity of materials like single phase catalysts to be explored. Both measurements can be combined to facilitate novel in situ experiments. We have used a horizontal energy dispersed x-ray beam and a photodiode array to detect transmission XAFS and a curved position sensitive detector positioned in the vertical plane to record XRD. This arrangement has been used to follow the formation of mixed oxide catalysts. SPIE Vol. 1550 X Rays in Materials Analysis Il: NovelApplications and Recent Developments(1991) / 97 Downloaded From: http://proceedings.spiedigitallibrary.org/ on 05/15/2015 Terms of Use: http://spiedl.org/terms

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Current and Future Energy Dispersive EXAFS Detector Systems

Cited by 2 publications

References 4 publications

Absorption Techniques inX‐Ray Spectrometry

Absorption Techniques inX‐Ray Spectrometry

<title>Combined x-ray absorption spectroscopy and x-ray powder diffraction</title>

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