2016
DOI: 10.3390/ma9020087
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Cu-Doped ZnO Thin Films Deposited by a Sol-Gel Process Using Two Copper Precursors: Gas-Sensing Performance in a Propane Atmosphere

Abstract: A study on the propane gas-sensing properties of Cu-doped ZnO thin films is presented in this work. The films were deposited on glass substrates by sol-gel and dip coating methods, using zinc acetate as a zinc precursor, copper acetate and copper chloride as precursors for doping. For higher sensitivity values, two film thickness values are controlled by the six and eight dippings, whereas for doping, three dippings were used, irrespective of the Cu precursor. The film structure was analyzed by X-ray diffracto… Show more

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Cited by 34 publications
(12 citation statements)
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“…All peaks are identical to those corresponding to the Cr 2 O 3 phase indexed in the rhombohedral structure with an R-3c space group, as described in the 072-3533 JCPDS card [31,32]. The strong intensity of the peaks representing the preferential orientation in the (104), (110) and (116) planes indicates that thin films exhibit good crystallinity [33]. Additionally, it is evident that no extra phases corresponding to either copper or copper oxides were detected from this technique.…”
Section: Results and Discussion A) Structural Characterizationmentioning
confidence: 56%
“…All peaks are identical to those corresponding to the Cr 2 O 3 phase indexed in the rhombohedral structure with an R-3c space group, as described in the 072-3533 JCPDS card [31,32]. The strong intensity of the peaks representing the preferential orientation in the (104), (110) and (116) planes indicates that thin films exhibit good crystallinity [33]. Additionally, it is evident that no extra phases corresponding to either copper or copper oxides were detected from this technique.…”
Section: Results and Discussion A) Structural Characterizationmentioning
confidence: 56%
“…In addition, no impurity traces or any other diffraction peak related to secondary phases from Cu, Cu 2 O, CuO, Ni, or NiO was detected within our XRD detection limit. This result suggests that Ni or Cu dopants used in this study did not form any new heterogeneous compound phases in the ZnO crystal but dissolved into the lattice matrix as a dopant [31].…”
Section: Resultsmentioning
confidence: 99%
“…This is probably because of the lower film porosity. A high film porosity is necessary to obtain better results with this HCs gas sensing mechanism [4950]. …”
Section: Resultsmentioning
confidence: 99%