CSAM: A clock skew-aware aging mitigation technique

Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits

“…Some earlier works (see, e.g., [14]) considered a DC stress condition. As was discussed before, during the actual circuit operation, different parts of the circuit may have different modes, and hence, the average AC stress condition may not enable us to accurately predict the impact of the NBTI effect on the lifetime [3,15]. Some recent works have included the workload dependency in the lifetime prediction in the presence of the NBTI effect.…”

“…The asymmetric aging due to the workload dependency would show themselves more clearly when power management techniques such as clock gating schemes are invoked [11,18,19]. This has been the motivation for proposing some aging mitigation technique for reducing the effect of the asymmetric aging on circuit timing by simultaneous consideration of NBTI-induced degradation on clock tree and logic path [15]. In all of the aforementioned works which considered the workload variations in the lifetime predictions, the operating temperature was assumed to be fixed.…”