2019
DOI: 10.1107/s1600576719009415
|View full text |Cite
|
Sign up to set email alerts
|

Crystallography at the nanoscale: planar defects in ZnO nanospikes

Abstract: The examination of anisotropic nanostructures, such as wires, platelets or spikes, inside a transmission electron microscope is normally performed only in plan view. However, intrinsic defects such as growth twin interfaces could occasionally be concealed from direct observation for geometric reasons, leading to superposition. This article presents the shadow-focused ion-beam technique to prepare multiple electron-beam-transparent cross-section specimens of ZnO nanospikes, via a procedure which could be readil… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2020
2020
2021
2021

Publication Types

Select...
3

Relationship

2
1

Authors

Journals

citations
Cited by 3 publications
(2 citation statements)
references
References 58 publications
(57 reference statements)
0
2
0
Order By: Relevance
“…An advancement in TEM preparation by Vieweg et al 20 allows site-specic sectioning via scanning electron microscopy (SEM) and FIB. 21,22 However, in the present case, the selection of nanostructures based on their ultrastructure, e.g. CS and NCS NPs, is only possible using TEM.…”
Section: Introductionmentioning
confidence: 99%
“…An advancement in TEM preparation by Vieweg et al 20 allows site-specic sectioning via scanning electron microscopy (SEM) and FIB. 21,22 However, in the present case, the selection of nanostructures based on their ultrastructure, e.g. CS and NCS NPs, is only possible using TEM.…”
Section: Introductionmentioning
confidence: 99%
“…ED pattern of a tilting series demonstrates that the ZnO rod exhibits a high crystal quality along the c axis showing strong diffraction patterns usually observed for a single component. However, ED patterns slightly tilted away from edge‐on zone‐axis observation conditions revealed multiple weak reflections which can indicate the presence of minor crystalline components [ 43 ] or can result from dynamical diffraction events in a thick specimen. See Figure S9, Supporting Information.…”
Section: Resultsmentioning
confidence: 99%