Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation

Yao, Lu; Moody, Michael P.; Cairney, Julie M.; Haley, Daniel; Ceguerra, Anna V.; Zhu, Chen; Ringer, Simon P.

doi:10.1016/j.ultramic.2010.11.018

Cited by 61 publications

(33 citation statements)

References 17 publications

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“…Atom probe tomography (APT), having the capacity to measure three-dimensional (3D) chemistry with equal detection sensitivity (of a few ppm) for all elements at near atomic spatial resolution [16], can provide answers to some of these questions. In certain cases, the spatial resolution of APT is even high enough to preserve three or more independent lattice planes in the 3D atom maps, enabling unambiguous indexing of grain orientations [1,23,28,39,40]. However, the spatial resolution is material-and measurement condition-dependent.…”

Section: Introductionmentioning

confidence: 99%

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

2015

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Section: Introductionmentioning

confidence: 99%

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

2015

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“…Furthermore, the Cr, W and Y signals outline the grain boundaries, showing the solute segregation at [43][44][45]). Further, traditional AEM can examine only a small number of grain boundaries per hour, and SEM does not have the spatial resolution to resolve the $2 nm thick solute-enriched regions.…”

Section: High Resolution Mappingmentioning

confidence: 96%

A review of advantages of high-efficiency X-ray spectrum imaging for analysis of nanostructured ferritic alloys

Parish

Miller

2015

Journal of Nuclear Materials

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a b s t r a c tNanostructured ferritic alloys (NFAs) exhibit complex microstructures consisting of 100-500 nm ferrite grains, grain boundary solute enrichment, and multiple populations of precipitates and nanoclusters (NCs). Understanding these materials' excellent creep and radiation-tolerance properties requires a combination of multiple atomic-scale experimental techniques. Recent advances in scanning transmission electron microscopy (STEM) hardware and data analysis methods have the potential to revolutionize nanometer-to micrometer-scale materials analysis. Modern high-brightness, high-X-ray collection STEM instruments are capable of enabling advanced experiments, such as simultaneous energy dispersive X-ray spectroscopy and electron energy loss spectroscopy spectrum imaging at nm to sub-nm resolution, that are now well-established for the study of nuclear materials. In this paper, we review past results and present new results illustrating the effectiveness of latest-generation STEM instrumentation and data analysis.

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“…More recently, grain boundary locations were also identified based on atomic density [45,46] and the local curvature can be derived subsequently [45]. Significant progress has been made on crystallographic reconstructions [47][48][49][50], such as estimating grain boundary misorientation angle based on pole-fitting [51] and extracting plane orientation from realspace data [52].…”

Section: Introductionmentioning

confidence: 99%

Grain boundary networks in nanocrystalline alloys from atom probe tomography quantization and autocorrelation mapping

Chen

Schuh

2015

Physica Status Solidi (a)

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A local spatial autocorrelation-based modelling method is developed to reconstruct nanoscale grain structures in nanocrystalline materials from atom probe tomography (APT) data, which provide atomic positions and species, with minimal noise. Using a nanocrystalline alloy with an average grain size of 16 nm as a model material, we reconstruct the three-dimensional grain boundary network by carrying out two series of APT data quantization using ellipsoidal binning, the first probing the anisotropy in the apparent local atomic density and the second quantifying the local spatial autocorrelation. This approach enables automatic and efficient quantification and visualization of grain structure in a large volume and at the finest nanoscale grain sizes, and provides a means for correlating local chemistry with grain boundaries or triple junctions in nanocrystalline materials.Nanoscale grain boundary networks are reconstructed from atom probe tomography data, which provide atomic positions and species for a fraction of atoms within a nanocrystalline material with an average grain size of 16 nm, using a quantization and local spatial autocorrelation-based approach.

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Crystallographic structural analysis in atom probe microscopy via 3D Hough transformation

Cited by 61 publications

References 17 publications

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography

A review of advantages of high-efficiency X-ray spectrum imaging for analysis of nanostructured ferritic alloys

Grain boundary networks in nanocrystalline alloys from atom probe tomography quantization and autocorrelation mapping

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