In this study, titanium dioxide (TiO 2 ) thin films were deposited on unheated glass substrates using an unbalanced magnetron sputtering system with different deposition times of 25, 35 and 45 min, respectively. The structure and surface morphology of TiO 2 thin films were characterized by atomic force microscopy (AFM) and transmission electron microscopy (TEM) with selected-area electron diffraction (SAED). It was found that the crystallite size of TiO 2 thin films was in the range of 10-20 nm, and the surface roughness was 1-3 nm. The SAED patterns show that the phase of TiO 2 thin films obtained in this study is anatase phase.